Inventor · disambiguated record
Tomoko Nobekawa
Also filed as: NOBEKAWA TOMOKO
3 granted patents·4 citations·filing 2006–2009
57Inventor score
Files withPANASONIC CORP3
Top patents by PatentIndex Score
3 records- 0149US7765446B2Method for testing semiconductor integrated circuit and method for verifying design rulesPANASONIC CORP·Filed 2009·Granted Jul 27, 2010·2 cites·3 claims
- 0249US7543206B2Method for testing semiconductor integrated circuit and method for verifying design rulesPANASONIC CORP·Filed 2006·Granted Jun 2, 2009·2 cites·9 claims
- 0333US7498967B2Semiconductor devicePANASONIC CORP·Filed 2007·Granted Mar 3, 2009·0 cites·19 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →