Inventor · disambiguated record
Toshiyuki Oyagi
Also filed as: OYAGI TOSHIYUKI
2 granted patents·1 pending application·2 citations·filing 2011–2014
34Inventor score
Technology areasH01J
Top patents by PatentIndex Score
3 records- 0168US10083814B2Electron microscope and sample observation methodHITACHI HIGH TECH CORP·Filed 2014·Granted Sep 25, 2018·2 cites·13 claims
- 0243US9754763B2Electron microscopeHITACHI HIGH TECH CORP·Filed 2014·Granted Sep 5, 2017·0 cites·5 claims
- 0327US2013062519A1Electron microscope, and method for adjustng optical axis of electron microscopeOYAGI TOSHIYUKI·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →