Inventor · disambiguated record
Toshifumi Ozaki
Also filed as: OZAKI TOSHIFUMI
22 granted patents·8 pending applications·488 citations·filing 1980–2008
96Inventor score
Top patents by PatentIndex Score
30 records- 0194US4942474ASolid-state imaging device having photo-electric conversion elements and other circuit elements arranged to provide improved photo-sensitivityHITACHI LTD·Filed 1988·Granted Jul 17, 1990·128 cites·30 claims
- 0292US4809075ASolid-state imaging device having an amplifying means in the matrix arrangement of picture elementsHITACHI LTD·Filed 1987·Granted Feb 28, 1989·93 cites·36 claims
- 0381US7535439B2Display device and method for driving a display deviceHITACHI DISPLAYS LTD·Filed 2006·Granted May 19, 2009·5 cites·10 claims
- 0478US4814848ASolid-state imaging deviceHITACHI LTD·Filed 1987·Granted Mar 21, 1989·37 cites·38 claims
- 0577US4349743ASolid-state imaging deviceHITACHI LTD·Filed 1980·Granted Sep 14, 1982·25 cites·10 claims
- 0674US4903122ASolid-state color imaging apparatus for extended definition television (EDTV)HITACHI LTD·Filed 1988·Granted Feb 20, 1990·28 cites·7 claims
- 0774US4689687ACharge transfer type solid-state imaging deviceHITACHI LTD·Filed 1985·Granted Aug 25, 1987·28 cites·15 claims
- 0868US4636985ASemiconductor memory having charge transfer device voltage amplifierHITACHI LTD·Filed 1984·Granted Jan 13, 1987·19 cites·33 claims
- 0966US7696959B2Display device and driving method of the sameHITACHI DISPLAYS LTD·Filed 2006·Granted Apr 13, 2010·1 cites·7 claims
- 1064US6437764B1Liquid crystal display deviceHITACHI LTD·Filed 1999·Granted Aug 20, 2002·28 cites·9 claims
- 1161US7190107B2Display devices provided with an arrangement of electron sources and control electrodesHITACHI DISPLAYS LTD·Filed 2003·Granted Mar 13, 2007·4 cites·2 claims
- 1260US4578707AMethod of reducing vertical smears of a solid state image sensorHITACHI LTD·Filed 1984·Granted Mar 25, 1986·14 cites·18 claims
- 1356US4621291ASolid-state imaging deviceHITACHI LTD·Filed 1983·Granted Nov 4, 1986·11 cites·2 claims
- 1456US4443818ASolid-state imaging deviceHITACHI LTD·Filed 1981·Granted Apr 17, 1984·11 cites·16 claims
- 1556US2007103087A1Display deviceHITACHI DISPLAYS LTD·Filed 2006·Application pending·0 cites
- 1654US4862487ASolid-state imaging deviceHITACHI LTD·Filed 1988·Granted Aug 29, 1989·12 cites·9 claims
- 1751US7180246B2Display deviceHITACHI DISPLAYS LTD·Filed 2004·Granted Feb 20, 2007·1 cites·10 claims
- 1851US2009001897A1Display DeviceOZAKI TOSHIFUMI·Filed 2008·Application pending·0 cites
- 1951US2008150934A1Image display deviceOZAKI TOSHIFUMI·Filed 2007·Application pending·0 cites
- 2051US2009033589A1Image Display DeviceOZAKI TOSHIFUMI·Filed 2008·Application pending·0 cites
- 2150US4577231AHigh sensitivity solid-state imaging deviceHITACHI LTD·Filed 1983·Granted Mar 18, 1986·9 cites·8 claims
- 2249US7221086B2Display device including a shield memberHITACHI DISPLAYS LTD·Filed 2003·Granted May 22, 2007·1 cites·5 claims
- 2347US2007052655A1Display deviceOZAKI TOSHIFUMI·Filed 2006·Application pending·0 cites
- 2446US2006208671A1Display deviceHITACHI DISPLAYS LTD·Filed 2006·Application pending·0 cites
- 2546US2006187151A1Display deviceOOISHI YOSHIHISA·Filed 2005·Application pending·0 cites
- 2645US4551742ASolid-state imaging deviceHITACHI LTD·Filed 1984·Granted Nov 5, 1985·10 cites·13 claims
- 2745US4532549ASolid-state imaging device with high quasi-signal sweep-out efficiency and high signal charge transfer efficiencyHITACHI LTD·Filed 1983·Granted Jul 30, 1985·9 cites·4 claims
- 2841US2005052117A1Field emission display deviceFiled 2004·Application pending·0 cites
- 2940US4908684ASolid-state imaging deviceHITACHI LTD·Filed 1987·Granted Mar 13, 1990·7 cites·9 claims
- 3034US5063581ASemiconductor imaging device having a plurality of photodiodes and charge coupled devicesHITACHI LTD·Filed 1990·Granted Nov 5, 1991·7 cites·22 claims
Join the waitlist — get patent alerts
Get an alert when Toshifumi Ozaki files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →