Inventor · disambiguated record
Tom H. Rafferty
Also filed as: RAFFERTY TOM H
7 granted patents·4 pending applications·76 citations·filing 2004–2023
82Inventor score
Top patents by PatentIndex Score
11 records- 0191US7292326B2Interferometric analysis for the manufacture of nano-scale devicesMOLECULAR IMPRINTS INC·Filed 2004·Granted Nov 6, 2007·47 cites·23 claims
- 0282US7630067B2Interferometric analysis method for the manufacture of nano-scale devicesMOLECULAR IMPRINTS INC·Filed 2004·Granted Dec 8, 2009·18 cites·12 claims
- 0378US7880872B2Interferometric analysis method for the manufacture of nano-scale devicesMOLECULAR IMPRINTS INC·Filed 2009·Granted Feb 1, 2011·8 cites·20 claims
- 0475US7785096B2Enhanced multi channel alignmentMOLECULAR IMPRINTS INC·Filed 2009·Granted Aug 31, 2010·3 cites·19 claims
- 0559US12405537B2Devices, systems, and methods for the transformation and cropping of drop patternsCANON KK·Filed 2021·Granted Sep 2, 2025·0 cites·23 claims
- 0655US2025198748A1Method of measuring edge eccentricity while wafer is on pre-alignerCANON KK·Filed 2023·Application pending·0 cites
- 0751US2007231421A1Enhanced Multi Channel AlignmentMOLECULAR IMPRINTS INC·Filed 2007·Application pending·0 cites
- 0849US11442359B2Method of separating a template from a shaped film on a substrateCANON KK·Filed 2019·Granted Sep 13, 2022·0 cites·8 claims
- 0943US2009148032A1Alignment Using Moire PatternsMOLECULAR IMPRINTS INC·Filed 2008·Application pending·0 cites
- 1043US2009147237A1Spatial Phase Feature LocationMOLECULAR IMPRINTS INC·Filed 2008·Application pending·0 cites
- 1142US11036130B2Drop placement evaluationCANON KK·Filed 2017·Granted Jun 15, 2021·0 cites·15 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →