Inventor · disambiguated record
Toshiharu Saitoh
Also filed as: SAITOH TOSHIHARU
10 granted patents·220 citations·filing 1995–2004
90Inventor score
Top patents by PatentIndex Score
10 records- 0190US6397361B1Reduced-pin integrated circuit I/O testIBM·Filed 1999·Granted May 28, 2002·93 cites·28 claims
- 0289US6304122B1Low power LSSD flip flops and a flushable single clock splitter for flip flopsIBM·Filed 2000·Granted Oct 16, 2001·42 cites·22 claims
- 0374US7222274B2Testing and repair methodology for memories having redundancyIBM·Filed 2004·Granted May 22, 2007·23 cites·26 claims
- 0469US7073100B2Method for testing embedded DRAM arraysIBM·Filed 2002·Granted Jul 4, 2006·16 cites·10 claims
- 0558US7237165B2Method for testing embedded DRAM arraysIBM·Filed 2004·Granted Jun 26, 2007·9 cites·18 claims
- 0651US6819160B2Self-timed and self-tested fuse blowIBM·Filed 2002·Granted Nov 16, 2004·5 cites·15 claims
- 0750US5679897APiezoelectric type acceleration sensor with metallic case and resin packageMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1995·Granted Oct 21, 1997·14 cites·22 claims
- 0845US5689514AMethod and apparatus for testing the address system of a memory systemIBM·Filed 1996·Granted Nov 18, 1997·10 cites·48 claims
- 0938US7543203B2LSSD-compatible edge-triggered shift register latchIBM·Filed 2004·Granted Jun 2, 2009·3 cites·20 claims
- 1035US5826006AMethod and apparatus for testing the data output system of a memory systemIBM·Filed 1996·Granted Oct 20, 1998·5 cites·27 claims
Join the waitlist — get patent alerts
Get an alert when Toshiharu Saitoh files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →