Inventor · disambiguated record
Toshiyuki Saruya
Also filed as: SARUYA TOSHIYUKI
6 granted patents·4 pending applications·8 citations·filing 2004–2025
69Inventor score
Files withYOKOGAWA ELECTRIC CORP10
Top patents by PatentIndex Score
10 records- 0161US2025172492A1Gas analyzer and gas analysis methodYOKOGAWA ELECTRIC CORP·Filed 2024·Application pending·0 cites
- 0260US2025076113A1Spectroscopic analysis device and spectroscopic analysis methodYOKOGAWA ELECTRIC CORP·Filed 2024·Application pending·0 cites
- 0360US2025189439A1Spectroscopic analysis device and spectroscopic analysis methodYOKOGAWA ELECTRIC CORP·Filed 2024·Application pending·0 cites
- 0455US7131337B2Pressure sensor and method for manufacturing pressure sensorYOKOGAWA ELECTRIC CORP·Filed 2004·Granted Nov 7, 2006·8 cites·13 claims
- 0551US12050128B2Spectroscopic analysis device and spectroscopic analysis methodYOKOGAWA ELECTRIC CORP·Filed 2020·Granted Jul 30, 2024·0 cites·10 claims
- 0651US11821835B2Spectroscopic analysis device and operation method and non-transitory computer-readable medium (CRM) storing program for spectroscopic analysisYOKOGAWA ELECTRIC CORP·Filed 2021·Granted Nov 21, 2023·0 cites·6 claims
- 0751US11650155B2Gas analysis system and gas analysis methodYOKOGAWA ELECTRIC CORP·Filed 2021·Granted May 16, 2023·0 cites·6 claims
- 0850US11940326B2Spectroscopic analysis device, optical system, and methodYOKOGAWA ELECTRIC CORP·Filed 2021·Granted Mar 26, 2024·0 cites·9 claims
- 0950US9373506B2Method for treating surface of diamond thin film, method for forming transistor, and sensor deviceYOKOGAWA ELECTRIC CORP·Filed 2014·Granted Jun 21, 2016·0 cites·17 claims
- 1050US2025305945A1Measurement apparatus, measurement method, and non-transitory computer readable mediumYOKOGAWA ELECTRIC CORP·Filed 2025·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →