Inventor · disambiguated record
Tokuhito Sasaki
Also filed as: SASAKI TOKUHITO
16 granted patents·3 pending applications·159 citations·filing 1992–2016
93Inventor score
Files withNEC CORP11NEC ELECTRONICS CORP3DIRECTOR GENERAL TECHNICAL RES1MASAHIRO OTA DIRECTOR GENERAL1MIZUTA YURIKO1
Top patents by PatentIndex Score
19 records- 0177US6127914AThin-film temperature-sensitive resistor material and production process thereofNEC CORP·Filed 1998·Granted Oct 3, 2000·35 cites·3 claims
- 0275US5801383AVOX film, wherein X is greater than 1.875 and less than 2.0, and a bolometer-type infrared sensor comprising the VOX filmMASAHIRO OTA DIRECTOR GENERAL·Filed 1996·Granted Sep 1, 1998·53 cites·18 claims
- 0374US7417229B2Thermal-type infrared detection elementNEC CORPORATIOIN·Filed 2006·Granted Aug 26, 2008·9 cites·9 claims
- 0473US8785853B2Infrared sensor package and electronic device equipped therewithYAMAZAKI TAKAO·Filed 2011·Granted Jul 22, 2014·3 cites·6 claims
- 0573US7239002B2Integrated circuit deviceNEC CORP·Filed 2005·Granted Jul 3, 2007·6 cites·20 claims
- 0671US7391092B2Integrated circuit including a temperature monitor element and thermal conducting layerNEC ELECTRONICS CORP·Filed 2005·Granted Jun 24, 2008·5 cites·18 claims
- 0768US6512229B2Process for preparing a bolometer material and bolometer deviceNEC CORP·Filed 2001·Granted Jan 28, 2003·7 cites·16 claims
- 0866US7462921B2Integrated circuit device, method of manufacturing the same and method of forming vanadium oxide filmNEC CORP·Filed 2005·Granted Dec 9, 2008·2 cites·20 claims
- 0963US9297701B2Electromagnetic wave detector with improved wavelength selection propertyNEC CORP·Filed 2014·Granted Mar 29, 2016·1 cites·20 claims
- 1061US7741692B2Integrated circuit device with temperature monitor membersNEC ELECTRONICS CORP·Filed 2005·Granted Jun 22, 2010·2 cites·10 claims
- 1156US6485619B2Method for forming metal oxide filmNEC CORP·Filed 2001·Granted Nov 26, 2002·2 cites·14 claims
- 1250US5290394AMethod of manufacturing a thin Hg1-x Cdx Te filmNEC CORP·Filed 1992·Granted Mar 1, 1994·19 cites·15 claims
- 1345US6413385B1Thin-film temperature-sensitive resistor material and production process thereofNEC CORP·Filed 2000·Granted Jul 2, 2002·2 cites·6 claims
- 1441US7777288B2Integrated circuit device and fabrication method thereforNEC ELECTRONICS CORP·Filed 2005·Granted Aug 17, 2010·0 cites·21 claims
- 1541US6333270B1Etching gas used for plasma-enhanced etching of vanadium oxide film and method of plasma-enhanced etching of vanadium oxide filmNEC CORP·Filed 1999·Granted Dec 25, 2001·7 cites·12 claims
- 1640US2002025683A1Etching gas used for plasma-enhanced etching of vanadium oxide film and method of plasma-enhanced etching of vanadium oxide filmNEC CORP·Filed 2001·Application pending·0 cites
- 1739US2006188400A1Thermal-type infrared detection elementNEC CORP·Filed 2006·Application pending·0 cites
- 1834US2016238453A1Infrared sensor manufactured by method suitable for mass productionMIZUTA YURIKO·Filed 2016·Application pending·0 cites
- 1929US5966590AMethod for manufacturing thermal-type infrared sensorDIRECTOR GENERAL TECHNICAL RES·Filed 1997·Granted Oct 12, 1999·6 cites·2 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →