Inventor · disambiguated record
Tomokazu Shimakura
Also filed as: SHIMAKURA TOMOKAZU
8 granted patents·3 pending applications·13 citations·filing 2002–2022
79Inventor score
Top patents by PatentIndex Score
11 records- 0179US12083357B2Radiation therapy apparatus and control method of radiation therapy apparatusHITACHI HIGH TECH CORP·Filed 2019·Granted Sep 10, 2024·4 cites·12 claims
- 0265US9773640B2Sample holder, charged particle beam apparatus, and observation methodHITACHI LTD·Filed 2015·Granted Sep 26, 2017·1 cites·10 claims
- 0365US9070532B2Charged particle beam apparatus sample holder with magnetic field generating element and sample holding elementHITACHI LTD·Filed 2014·Granted Jun 30, 2015·1 cites·13 claims
- 0462US8766185B2Charged particle beam deviceSHIMAKURA TOMOKAZU·Filed 2010·Granted Jul 1, 2014·2 cites·15 claims
- 0553US6879152B2Evaluation system and method of measuring a quantitative magnetic field of a magnetic materialHITACHI LTD·Filed 2002·Granted Apr 12, 2005·4 cites·17 claims
- 0650US11058894B2Particle beam therapy device and irradiation field forming methodHITACHI LTD·Filed 2019·Granted Jul 13, 2021·0 cites·10 claims
- 0750US6744249B2Method and instrument for measuring a magnetic field, a method for measuring a current waveform, and method for measuring an electric fieldHITACHI LTD·Filed 2002·Granted Jun 1, 2004·1 cites·20 claims
- 0850US2024189625A1Irradiation nozzle, particle therapy apparatus, particle therapy system, and method for controlling particle therapy systemHITACHI LTD·Filed 2022·Application pending·0 cites
- 0945US2007194230A1Inspection instrument of a magnetic specimenKOHASHI TERUO·Filed 2007·Application pending·0 cites
- 1041US2007057666A1Defect inspection system and method for recording mediaSHIMAKURA TOMOKAZU·Filed 2006·Application pending·0 cites
- 1140US8410438B2Charged particle beam deviceSHIMAKURA TOMOKAZU·Filed 2011·Granted Apr 2, 2013·0 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →