Inventor · disambiguated record
Toshihisa Sone
Also filed as: SONE TOSHIHISA
16 granted patents·42 citations·filing 1998–2023
91Inventor score
Top patents by PatentIndex Score
16 records- 0196US11854952B2Semiconductor device and measurement deviceLAPIS SEMICONDUCTOR CO LTD·Filed 2022·Granted Dec 26, 2023·2 cites·4 claims
- 0291US8921987B2Semiconductor device and measurement device having an oscillatorLAPIS SEMICONDUCTOR CO LTD·Filed 2013·Granted Dec 30, 2014·8 cites·20 claims
- 0385US12347757B2Semiconductor device and measurement deviceLAPIS SEMICONDUCTOR CO LTD·Filed 2023·Granted Jul 1, 2025·0 cites·4 claims
- 0485US9197217B2Semiconductor device, measurement device, and correction methodLAPIS SEMICONDUCTOR CO LTD·Filed 2013·Granted Nov 24, 2015·5 cites·17 claims
- 0578US9584134B2Correcting temperature based oscillation frequency errors in semiconductor deviceLAPIS SEMICONDUCTOR CO LTD·Filed 2015·Granted Feb 28, 2017·2 cites·15 claims
- 0675US10243515B2Semiconductor device and measurement deviceLAPIS SEMICONDUCTOR CO LTD·Filed 2017·Granted Mar 26, 2019·2 cites·15 claims
- 0774US7362161B2Power supply switching circuit, data processing device, and method of controlling data processing deviceOKI ELECTRIC IND CO LTD·Filed 2006·Granted Apr 22, 2008·7 cites·8 claims
- 0873US9787250B2Semiconductor device and measurement deviceLAPIS SEMICONDUCTOR CO LTD·Filed 2016·Granted Oct 10, 2017·2 cites·10 claims
- 0971US11309234B2Semiconductor device having an oscillator and an associated integrated circuitLAPIS SEMICONDUCTOR CO LTD·Filed 2020·Granted Apr 19, 2022·0 cites·1 claims
- 1059US9257377B2Semiconductor device and measurement device having an oscillatorLAPIS SEMICONDUCTOR CO LTD·Filed 2014·Granted Feb 9, 2016·0 cites·13 claims
- 1158US10411715B2Semiconductor device, measurement device, and correction methodLAPIS SEMICONDUCTOR CO LTD·Filed 2017·Granted Sep 10, 2019·0 cites·13 claims
- 1257US9838022B2Semiconductor device with oscillation frequency error correctionLAPIS SEMICONDUCTOR CO LTD·Filed 2017·Granted Dec 5, 2017·0 cites·14 claims
- 1356US10615108B2Semiconductor device and measurement deviceLAPIS SEMICONDUCTOR CO LTD·Filed 2016·Granted Apr 7, 2020·0 cites·15 claims
- 1455US10622944B2Semiconductor device and measurement deviceLAPIS SEMICONDUCTOR CO LTD·Filed 2019·Granted Apr 14, 2020·0 cites·4 claims
- 1552US9230890B2Semiconductor device and measurement deviceLAPIS SEMICONDUCTOR CO LTD·Filed 2013·Granted Jan 5, 2016·0 cites·16 claims
- 1648US6233201B1Voltage monitoring circuit and memory card incorporating the sameOKI ELECTRIC IND CO LTD·Filed 1998·Granted May 15, 2001·14 cites·19 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →