Inventor · disambiguated record
Tomoyuki Taguchi
Also filed as: TAGUCHI TOMOYUKI
17 granted patents·22 pending applications·381 citations·filing 1993–2025
93Inventor score
Files withYOKOGAWA ELECTRIC CORP22IBM5YAMAMURA GLASS CO LTD4UNIV TOKYO AGRICULTURE2CMO JAPAN CO LTD1
Top patents by PatentIndex Score
39 records- 0194US5691256AGlass composition for magnetic disk substrates and magnetic disk substrateYAMAMURA GLASS CO LTD·Filed 1996·Granted Nov 25, 1997·112 cites·6 claims
- 0292US5874376AMagnetic disk substrateYAMAMURA GLASS CO LTD·Filed 1997·Granted Feb 23, 1999·79 cites·18 claims
- 0385US5726108AGlass-ceramic magnetic disk substrateYAMAMURA GLASS CO LTD·Filed 1997·Granted Mar 10, 1998·68 cites·5 claims
- 0479US8877918B2Nucleic acid extraction methodOZEKI YOSHIHIRO·Filed 2012·Granted Nov 4, 2014·6 cites·13 claims
- 0577US8357530B2Microfluidic device for trapping single cellUNIV TOKYO NAT UNIV CORP·Filed 2008·Granted Jan 22, 2013·10 cites·10 claims
- 0676US6791350B2Inspection method for array substrate and inspection device for the sameIBM·Filed 2001·Granted Sep 14, 2004·17 cites·16 claims
- 0775US12215380B2Nucleic acid sequence measurement deviceYOKOGAWA ELECTRIC CORP·Filed 2019·Granted Feb 4, 2025·1 cites·15 claims
- 0875US5468694AComposition for producing low temperature co-fired substrateYAMAMURA GLASS CO LTD·Filed 1993·Granted Nov 21, 1995·61 cites·20 claims
- 0974US9797003B2Nucleic acid sequence measuring method, nucleic acid sequence measuring device, manufacturing method for nucleic acid sequence measuring device, and nucleic acid sequence measuring apparatusYOKOGAWA ELECTRIC CORP·Filed 2014·Granted Oct 24, 2017·1 cites·16 claims
- 1071US2025215375A1Apparatus and methodYOKOGAWA ELECTRIC CORP·Filed 2024·Application pending·0 cites
- 1171US2025215381A1Apparatus and methodYOKOGAWA ELECTRIC CORP·Filed 2024·Application pending·0 cites
- 1269US2024384338A1Nucleic acid sequence measurement apparatus, nucleic acid sequence measurement method, nucleic acid sequence measurement device, and storage mediumYOKOGAWA ELECTRIC CORP·Filed 2024·Application pending·0 cites
- 1368US2025205709A1Filter suction holder, nucleic acid extraction system, and nucleic acid extraction methodYOKOGAWA ELECTRIC CORP·Filed 2024·Application pending·0 cites
- 1465US6930505B2Inspection method and apparatus for EL array substrateIBM·Filed 2003·Granted Aug 16, 2005·15 cites·20 claims
- 1565US2025215510A1Apparatus, method, and non-transitory computer-readable mediumYOKOGAWA ELECTRIC CORP·Filed 2024·Application pending·0 cites
- 1664US7795165B2Lead-free bismuth glassDU PONT·Filed 2006·Granted Sep 14, 2010·2 cites·6 claims
- 1764US2024182836A1Filtration member, concentration apparatus, and concentration methodYOKOGAWA ELECTRIC CORP·Filed 2022·Application pending·0 cites
- 1861US7508229B2Method and device for testing array substrateIBM·Filed 2005·Granted Mar 24, 2009·1 cites·10 claims
- 1961US2023407411A1Method for producing complex, method for determining microbial inclusion, and method for identifying included microorganismYOKOGAWA ELECTRIC CORP·Filed 2023·Application pending·0 cites
- 2059US2024142363A1Measurement method and measurement systemYOKOGAWA ELECTRIC CORP·Filed 2022·Application pending·0 cites
- 2158US2025290797A1Fluorescence reading device and fluorescence reading methodYOKOGAWA ELECTRIC CORP·Filed 2025·Application pending·0 cites
- 2258US2023391645A1Water treatment method, control apparatus, and water treatment systemYOKOGAWA ELECTRIC CORP·Filed 2021·Application pending·0 cites
- 2357US2024150815A1Measurement method and measurement systemYOKOGAWA ELECTRIC CORP·Filed 2022·Application pending·0 cites
- 2456US2024167918A1Water sampling method, water sampling device, and water sampling systemYOKOGAWA ELECTRIC CORP·Filed 2022·Application pending·0 cites
- 2555US7282943B2Inspection device for inspecting TFTIBM·Filed 2004·Granted Oct 16, 2007·8 cites·9 claims
- 2654US11781103B2Microorganism contamination countermeasure selection device, microorganism contamination countermeasure selection system, microorganism contamination countermeasure selection method, and non-transitory computer readable storage mediumYOKOGAWA ELECTRIC CORP·Filed 2017·Granted Oct 10, 2023·0 cites·11 claims
- 2754US11293867B2Biochip, biochip unit, biochip reading device, and biochip manufacturing methodYOKOGAWA ELECTRIC CORP·Filed 2018·Granted Apr 5, 2022·0 cites·11 claims
- 2854US2024068014A1Nucleic acid sequence measurement methodYOKOGAWA ELECTRIC CORP·Filed 2022·Application pending·0 cites
- 2953US2025297299A1Culture vessel, culture kit, and method for performing falling bacteria test of microorganismsYOKOGAWA ELECTRIC CORP·Filed 2025·Application pending·0 cites
- 3052US2023323448A1Nucleic acid sequence measurement method and nucleic acid sequence measurement kitYOKOGAWA ELECTRIC CORP·Filed 2021·Application pending·0 cites
- 3150US2023314419A1Target measurement method, target measurement device, target measurement apparatus, and target measurement kitYOKOGAWA ELECTRIC CORP·Filed 2021·Application pending·0 cites
- 3247US2023002813A1Nucleic acid sequence measuring apparatus, nucleic acid sequence measuring method, and non-transitory recording mediumYOKOGAWA ELECTRIC CORP·Filed 2020·Application pending·0 cites
- 3347US2013014545A1Drum-type washing machinePANASONIC CORP·Filed 2012·Application pending·0 cites
- 3446US2022136039A1Nucleic acid sequence measurement device, nucleic acid sequence measurement method, and nucleic acid sequence measurement apparatusYOKOGAWA ELECTRIC CORP·Filed 2020·Application pending·0 cites
- 3541US7209843B2Circuit inspection method, method of manufacturing liquid-crystal display, and circuit inspection apparatusCMO JAPAN CO LTD·Filed 2005·Granted Apr 24, 2007·0 cites·13 claims
- 3641US2008164902A1Inspection device for inspecting tftSAKAGUCHI YOSHITAMI·Filed 2007·Application pending·0 cites
- 3740US2011060136A1Dendrimer-coated magnetic fine particles, and method for preparing same and utility thereofUNIV TOKYO AGRICULTURE·Filed 2010·Application pending·0 cites
- 3840US2011057145A1Method for preparing dendrimer-modified, magnetic fine particlesUNIV TOKYO AGRICULTURE·Filed 2010·Application pending·0 cites
- 3938US7269051B2Inspection method of array board and inspection equipment thereofIBM·Filed 2005·Granted Sep 11, 2007·0 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →