Inventor · disambiguated record
Tokuji Takahashi
Also filed as: TAKAHASHI TOKUJI
5 granted patents·235 citations·filing 1976–1995
85Inventor score
Top patents by PatentIndex Score
5 records- 0193US5587792AApparatus and method for measuring thickness of thin semiconductor multi-layer filmFiled 1995·Granted Dec 24, 1996·106 cites·6 claims
- 0287US5523840AMethod and apparatus for measuring the thicknesses of layers of a multiple layer semiconductor film utilizing the comparison between a spatialgram and an optical characteristic matrixMITSUBISHI ELECTRIC CORP·Filed 1994·Granted Jun 4, 1996·54 cites·2 claims
- 0377US4110047AInspection apparatus for automatically detecting the unevenness or the flaws of a coatingKONISHIROKU PHOTO IND·Filed 1976·Granted Aug 29, 1978·27 cites·10 claims
- 0462US5542707ASubframe assembly for vehicleHONDA MOTOR CO LTD·Filed 1995·Granted Aug 6, 1996·33 cites·17 claims
- 0550US5371596AOptical apparatus components having spectrally overlapping characteristics for measuring semiconductor layer thicknessJASCO CORP·Filed 1993·Granted Dec 6, 1994·15 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →