Inventor · disambiguated record
Tomochika Takeshima
Also filed as: TAKESHIMA TOMOCHIKA
7 granted patents·6 pending applications·2 citations·filing 2011–2024
70Inventor score
Top patents by PatentIndex Score
13 records- 0165US9405958B2Cell analysis method, cell analysis device, and cell analysis programSUGIYAMA NORIKAZU·Filed 2012·Granted Aug 2, 2016·2 cites·25 claims
- 0258US2024257490A1Focal position estimation method, focal position estimation system, model generation method, model generation system, focal position estimation model, and non-transitory computer-readable storage mediumHAMAMATSU PHOTONICS KK·Filed 2024·Application pending·0 cites
- 0357US2024402092A1Autofocus assistance method, autofocus assistance device, and autofocus assistance programHAMAMATSU PHOTONICS KK·Filed 2022·Application pending·0 cites
- 0454US12094138B2Semiconductor inspection device and semiconductor inspection methodHAMAMATSU PHOTONICS KK·Filed 2020·Granted Sep 17, 2024·0 cites·10 claims
- 0552US12360056B2Semiconductor apparatus examination method and semiconductor apparatus examination apparatusHAMAMATSU PHOTONICS KK·Filed 2020·Granted Jul 15, 2025·0 cites·20 claims
- 0652US12211199B2Method for inspecting semiconductor and semiconductor inspecting deviceHAMAMATSU PHOTONICS KK·Filed 2020·Granted Jan 28, 2025·0 cites·14 claims
- 0752US2018322329A1Image processing device, imaging device, microscope device, image processing method, and image processing programHAMAMATSU PHOTONICS KK·Filed 2018·Application pending·0 cites
- 0851US2024290080A1Feature output model generation system, feature output model generation method, feature output model generation program, and feature output modelHAMAMATSU PHOTONICS KK·Filed 2022·Application pending·0 cites
- 0951US2024160089A1Focal position estimation system, focal position estimation method, focal position estimation program, semiconductor inspection system and biological observation systemHAMAMATSU PHOTONICS KK·Filed 2022·Application pending·0 cites
- 1049US12044729B2Semiconductor device examination method and semiconductor device examination deviceHAMAMATSU PHOTONICS KK·Filed 2020·Granted Jul 23, 2024·0 cites·20 claims
- 1146US10055638B2Image processing device, imaging device, microscope device, image processing method, and image processing programHAMAMATSU PHOTONICS KK·Filed 2012·Granted Aug 21, 2018·0 cites·4 claims
- 1246US2024282000A1Incline estimation system, incline estimation method, incline estimation program, semiconductor inspection system, and organism observation systemHAMAMATSU PHOTONICS KK·Filed 2022·Application pending·0 cites
- 1328US8885919B2Semiconductor fault analysis device and fault analysis methodTAKESHIMA TOMOCHIKA·Filed 2011·Granted Nov 11, 2014·0 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →