Inventor · disambiguated record
Tomo Tanaka
Also filed as: TANAKA TOMO-O · Tanaka Tomo
14 granted patents·13 pending applications·6 citations·filing 2010–2025
84Inventor score
Top patents by PatentIndex Score
27 records- 0193US11650104B2Bolometer and method for manufacturing sameNEC CORP·Filed 2021·Granted May 16, 2023·3 cites·12 claims
- 0288US11733102B2Bolometer-type detector and method for manufacturing the sameNEC CORP·Filed 2022·Granted Aug 22, 2023·1 cites·10 claims
- 0387US12055440B2Bolometer and method for manufacturing sameNEC CORP·Filed 2022·Granted Aug 6, 2024·1 cites·10 claims
- 0465US2025347564A1Bolometer array, bolometer array unit, and light detection methodNEC CORP·Filed 2025·Application pending·0 cites
- 0561US8922103B2Spark plugYOSHIMOTO OSAMU·Filed 2010·Granted Dec 30, 2014·1 cites·8 claims
- 0661US2024276863A1Element using carbon nanotube film, a bolometer using the same and a method for manufacturing the sameNEC CORP·Filed 2024·Application pending·0 cites
- 0760US2025155293A1Bolometer and bolometer arrayNEC CORP·Filed 2024·Application pending·0 cites
- 0858US2024377261A1Bolometer-type infrared detector and method of manufacturing the sameNEC CORP·Filed 2024·Application pending·0 cites
- 0957US2024210247A1Bolometer and method for manufacturing the sameNEC CORP·Filed 2023·Application pending·0 cites
- 1056US12356754B2Infrared sensor using carbon nanotubes and method for manufacturing sameNEC CORP·Filed 2020·Granted Jul 8, 2025·0 cites·16 claims
- 1156US2022064401A1Stretch-formed productNEC CORP·Filed 2020·Application pending·0 cites
- 1256US2023384165A1Bolometer-type infrared detector and method for manufacturing the sameNEC CORP·Filed 2023·Application pending·0 cites
- 1356US2024349610A1Element, bolometer, and element manufacturing methodNEC CORP·Filed 2024·Application pending·0 cites
- 1455US11495458B2Manufacturing method and semiconductor elementNEC CORP·Filed 2021·Granted Nov 8, 2022·0 cites·14 claims
- 1552US2024394904A1Extraction device, image analysis device, creating device, evaluation system, correlation distance extraction method, and recording mediumNEC CORP·Filed 2024·Application pending·0 cites
- 1651US11901389B2Infrared sensor and imaging apparatusNEC CORP·Filed 2021·Granted Feb 13, 2024·0 cites·10 claims
- 1751US8853928B2Spark plug electrode, method for producing same, spark plug, and method for producing spark plugTANAKA TOMO-O·Filed 2011·Granted Oct 7, 2014·0 cites·15 claims
- 1849US2023288262A1Bolometer material, infrared sensor and method for manufacturing sameNEC CORP·Filed 2021·Application pending·0 cites
- 1947US2022034720A1Bolometer and method for manufacturing sameNEC CORP·Filed 2021·Application pending·0 cites
- 2046US9783872B2Electrode material and spark plugNGK SPARK PLUG CO·Filed 2014·Granted Oct 10, 2017·0 cites·10 claims
- 2146US8729783B2Spark plug electrode, method for producing same, spark plug, and method for producing spark plugTANAKA TOMO-O·Filed 2011·Granted May 20, 2014·0 cites·15 claims
- 2245US11195963B2Texture structure manufacturing methodNEC CORP·Filed 2018·Granted Dec 7, 2021·0 cites·19 claims
- 2345US8593045B2Spark plugYOSHIMOTO OSAMU·Filed 2011·Granted Nov 26, 2013·0 cites·7 claims
- 2443US2013026903A1Spark plugNGK SPARK PLUG CO·Filed 2011·Application pending·0 cites
- 2542US9997797B2Electrochemical reaction unit and fuel cell stackNGK SPARK PLUG CO·Filed 2016·Granted Jun 12, 2018·0 cites·8 claims
- 2641US12307201B2Analysis system, analysis method, and recording mediumNEC CORP·Filed 2022·Granted May 20, 2025·0 cites·12 claims
- 2741US2023376688A1Data generation system, data generation method, and recording mediumNEC CORP·Filed 2023·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →