Inventor · disambiguated record
Toru Taura
Also filed as: TAURA TORU
15 granted patents·6 pending applications·502 citations·filing 1995–2013
94Inventor score
Top patents by PatentIndex Score
21 records- 0196US6400168B2Method for fabricating probe tip portion composed by coaxial cableNEC CORP·Filed 2001·Granted Jun 4, 2002·116 cites·6 claims
- 0293US6281691B1Tip portion structure of high-frequency probe and method for fabrication probe tip portion composed by coaxial cableNEC CORP·Filed 1999·Granted Aug 28, 2001·119 cites·22 claims
- 0391US8190086B2Transmission method, interface circuit, semiconductor device, semiconductor package, semiconductor module and memory moduleSASAKI HIDEKI·Filed 2006·Granted May 29, 2012·28 cites·35 claims
- 0491US6310483B1Longitudinal type high frequency probe for narrow pitched electrodesNEC CORP·Filed 1998·Granted Oct 30, 2001·116 cites·27 claims
- 0589US9166300B2Slot antennaTAURA TORU·Filed 2011·Granted Oct 20, 2015·14 cites·15 claims
- 0689US8144482B2Circuit board device, wiring board interconnection method, and circuit board module deviceSATO JUNYA·Filed 2007·Granted Mar 27, 2012·22 cites·20 claims
- 0786US9472855B2Antenna deviceTOYAO HIROSHI·Filed 2012·Granted Oct 18, 2016·9 cites·10 claims
- 0882US7906846B2Semiconductor device for implementing signal transmission and/or power supply by means of the induction of a coilNEC CORP·Filed 2006·Granted Mar 15, 2011·8 cites·19 claims
- 0975US6242930B1High-frequency probe capable of adjusting characteristic impedance in end part and having the end part detachableNEC CORP·Filed 1998·Granted Jun 5, 2001·41 cites·23 claims
- 1073US7852101B2Semiconductor device testing apparatus and power supply unit for semiconductor device testing apparatusNEC CORP·Filed 2006·Granted Dec 14, 2010·7 cites·15 claims
- 1157US6486688B2Semiconductor device testing apparatus having a contact sheet and probe for testing high frequency characteristicsNEC CORP·Filed 2001·Granted Nov 26, 2002·8 cites·38 claims
- 1246US9456499B2Structural body and interconnect substrateTOYAO HIROSHI·Filed 2011·Granted Sep 27, 2016·0 cites·17 claims
- 1344US8982003B2Slot antenna, electronic apparatus, and method for manufacturing slot antennaTAURA TORU·Filed 2010·Granted Mar 17, 2015·0 cites·10 claims
- 1443US2015009093A1Antenna apparatus and portable wireless device equipped with the sameNEC CORP·Filed 2013·Application pending·0 cites
- 1542US5614944ATest method and apparatus of sequentially executing synchronous signal test, dot level test, and gradation test of a video signal generatorNEC CORP·Filed 1995·Granted Mar 25, 1997·10 cites·50 claims
- 1641US2010207835A1Slot antennaTAURA TORU·Filed 2008·Application pending·0 cites
- 1741US2010289713A1Slot antennaTAURA TORU·Filed 2008·Application pending·0 cites
- 1841US2015009082A1Slot antennaTAURA TORU·Filed 2013·Application pending·0 cites
- 1941US2010225544A1Slot antenna and portable wireless terminalTAURA TORU·Filed 2008·Application pending·0 cites
- 2037US2012162040A1Mobile wireless terminalTAURA TORU·Filed 2010·Application pending·0 cites
- 2133US6229321B1Process for manufacturing high frequency multichip module enabling independent test of bare chipNEC CORP·Filed 1999·Granted May 8, 2001·4 cites·9 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →