Inventor · disambiguated record
Toshimasa Tomoda
Also filed as: TOMODA TOSHIMASA
18 granted patents·343 citations·filing 1979–1996
95Inventor score
Top patents by PatentIndex Score
18 records- 0187US4788852AMetering chokePETRO CANADA INC·Filed 1986·Granted Dec 6, 1988·77 cites·8 claims
- 0273US4841489AMethod of imaging an object by ultrasonic or electromagnetic wavesMITSUBISHI ELECTRIC CORP·Filed 1986·Granted Jun 20, 1989·37 cites·15 claims
- 0369US5864374AMethod and apparatus for image generationMITSUBISHI ELECTRIC CORP·Filed 1996·Granted Jan 26, 1999·42 cites·12 claims
- 0467US4682036AGamma ray compensation-type neutron ionization chamberJAPAN ATOMIC ENERGY RES INST·Filed 1985·Granted Jul 21, 1987·18 cites·6 claims
- 0566US5289260APattern defect detection device and a spatial frequency filter used thereinMITSUBISHI ELECTRIC CORP·Filed 1991·Granted Feb 22, 1994·25 cites·8 claims
- 0665US6337724B1Image display systemMITSUBISHI ELECTRIC CORP·Filed 1996·Granted Jan 8, 2002·35 cites·28 claims
- 0758US4410483ANeutron detector for use within nuclear reactorMITSUBISHI ELECTRIC CORP·Filed 1981·Granted Oct 18, 1983·8 cites·3 claims
- 0857US4379248AIonization chamber having coaxially arranged cylindrical electrodesMITSUBISHI ELECTRIC CORP·Filed 1979·Granted Apr 5, 1983·8 cites·8 claims
- 0952US5170063AInspection device for detecting defects in a periodic pattern on a semiconductor waferMITSUBISHI ELECTRIC CORP·Filed 1991·Granted Dec 8, 1992·15 cites·5 claims
- 1052US4885759AMeasurement apparatus employing radiationMITSUBISHI ELECTRIC CORP·Filed 1987·Granted Dec 5, 1989·17 cites·8 claims
- 1151US5379150AMethod of manufacturing a spatial frequency filter for use in a pattern defect detection deviceMITSUBISHI ELECTRIC CORP·Filed 1993·Granted Jan 3, 1995·13 cites·5 claims
- 1250US4302696AGamma-ray compensated ionization chamberMITSUBISHI ELECTRIC CORP·Filed 1979·Granted Nov 24, 1981·6 cites·5 claims
- 1345US5030842AFine-particle measuring apparatusMITSUBISHI ELECTRIC CORP·Filed 1990·Granted Jul 9, 1991·12 cites·15 claims
- 1445US5008558ASystem for detecting minute particles on or above a substrateMITSUBISHI ELECTRIC CORP·Filed 1989·Granted Apr 16, 1991·10 cites·7 claims
- 1540US5305366AThin film forming apparatusMITSUBISHI ELECTRIC CORP·Filed 1992·Granted Apr 19, 1994·9 cites·38 claims
- 1637US4587429AMethods of improving radiation resistant characteristic of BF3 proportional countersMITSUBISHI ELECTRIC CORP·Filed 1983·Granted May 6, 1986·4 cites·6 claims
- 1733US4817122AApparatus for radiation analysisMITSUBISHI ELECTRIC CORP·Filed 1986·Granted Mar 28, 1989·6 cites·7 claims
- 1829US4785409ASystem for making standard deviations in quantum noise constant throughout a screen displayMITSUBISHI ELECTRIC CORP·Filed 1986·Granted Nov 15, 1988·1 cites·9 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →