Inventor · disambiguated record
Toshiyuki Tsujii
Also filed as: TSUJII TOSHIYUKI
8 granted patents·146 citations·filing 1996–2000
88Inventor score
Files withMITSUBISHI ELECTRIC CORP8
Top patents by PatentIndex Score
8 records- 0179US6489791B1Build off self-test (Bost) testing methodMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Dec 3, 2002·23 cites·3 claims
- 0267US6300577B1Film carrier and method of burn-in testingMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Oct 9, 2001·29 cites·14 claims
- 0359US5894172ASemiconductor device with identification functionMITSUBISHI ELECTRIC CORP·Filed 1996·Granted Apr 13, 1999·26 cites·2 claims
- 0458US6519728B2Semiconductor integrated circuit having test circuitMITSUBISHI ELECTRIC CORP·Filed 1999·Granted Feb 11, 2003·22 cites·9 claims
- 0550US6006350ASemiconductor device testing apparatus and method for testing memory and logic sections of a semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 1997·Granted Dec 21, 1999·15 cites·17 claims
- 0649US6351836B1Semiconductor device with boundary scanning circuitMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Feb 26, 2002·15 cites·29 claims
- 0741US6486691B2Tester for a semiconductor IC circuit having multiple pinsMITSUBISHI ELECTRIC CORP·Filed 1999·Granted Nov 26, 2002·10 cites·10 claims
- 0835US6393593B1Tester and method for testing LSI designed for scan methodMITSUBISHI ELECTRIC CORP·Filed 1999·Granted May 21, 2002·6 cites·6 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →