Inventor · disambiguated record
Toshikazu Tsutsui
Also filed as: TSUTSUI TOSHIKAZU
5 granted patents·2 pending applications·165 citations·filing 1996–2002
83Inventor score
Files withMITSUBISHI ELECTRIC CORP7
Top patents by PatentIndex Score
7 records- 0180US5844850AApparatus for analyzing a failure in a semiconductor wafer and method thereofMITSUBISHI ELECTRIC CORP·Filed 1996·Granted Dec 1, 1998·70 cites·8 claims
- 0271US6009545ASystem for analyzing a failure in a semiconductor wafer by calculating correlation coefficient between collated data of defects per prescribed unit and failures per prescribed unitMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Dec 28, 1999·45 cites·9 claims
- 0362US5905650AFailure analyzerMITSUBISHI ELECTRIC CORP·Filed 1997·Granted May 18, 1999·25 cites·20 claims
- 0456US6016278AFailure analysis method and deviceMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Jan 18, 2000·23 cites·18 claims
- 0532US2003057988A1Semiconductor device inspecting method using conducting AFMMITSUBISHI ELECTRIC CORP·Filed 2002·Application pending·0 cites
- 0632US2003200056A1Semiconductor device analysis systemMITSUBISHI ELECTRIC CORP·Filed 2002·Application pending·0 cites
- 0725US6060781ASemiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 1999·Granted May 9, 2000·2 cites·8 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →