Inventor · disambiguated record
Todd Christopher Wilson
Also filed as: WILSON TODD CHRISTOPHER
11 granted patents·820 citations·filing 2012–2022
94Inventor score
Top patents by PatentIndex Score
11 records- 0198US11158422B1Measurement and testing system that includes a data processing device configured to synchronize first and second signals by using time-delayed values or reconstructed values occurring coincident with a transition of a digital time reference signalBERTEC CORP·Filed 2020·Granted Oct 26, 2021·35 cites·11 claims
- 0298US10331324B1Measurement and testing systemBERTEC CORP·Filed 2017·Granted Jun 25, 2019·65 cites·10 claims
- 0398US9829311B1Force measurement systemBERTEC CORP·Filed 2015·Granted Nov 28, 2017·69 cites·15 claims
- 0498US9043278B1System and method for the merging of databasesBERTEC CORP·Filed 2014·Granted May 26, 2015·107 cites·17 claims
- 0598US8902249B1Measurement and testing systemBERTEC CORP·Filed 2013·Granted Dec 2, 2014·97 cites·23 claims
- 0698US8700569B1System and method for the merging of databasesBERTEC CORP·Filed 2013·Granted Apr 15, 2014·124 cites·18 claims
- 0798US8643669B1Measurement and testing systemBERTEC CORP·Filed 2012·Granted Feb 4, 2014·93 cites·17 claims
- 0896US11816258B1Head-mounted display systemBERTEC CORP·Filed 2022·Granted Nov 14, 2023·12 cites·16 claims
- 0996US10803990B1Measurement and testing system that includes a data processing device configured to synchronize a first plurality of data values with a second plurality of data values by determining which first timestamps correspond to which second timestamps and to interpolate values missing from the second valuesBERTEC CORP·Filed 2019·Granted Oct 13, 2020·45 cites·4 claims
- 1096US9200897B1Measurement and testing systemBERTEC CORP·Filed 2014·Granted Dec 1, 2015·73 cites·9 claims
- 1195US8543540B1System and method for the merging of databasesWILSON TODD CHRISTOPHER·Filed 2012·Granted Sep 24, 2013·100 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →