Inventor · disambiguated record
Toshio Yamamura
Also filed as: YAMAMURA TOSHIO
34 granted patents·782 citations·filing 1976–2020
98Inventor score
Files withTOSHIBA KK19TOSHIBA MEMORY CORP4NAKAMURA HIROSHI3TOKYO SHIBAURA ELECTRIC CO3YAMAMURA TOSHIO2
Top patents by PatentIndex Score
34 records- 0197US4274005AX-ray apparatus for computed tomography scannerTOKYO SHIBAURA ELECTRIC CO·Filed 1979·Granted Jun 16, 1981·167 cites·24 claims
- 0293US8477541B2Semiconductor integrated circuit adapted to output pass/fail results of internal operationsNAKAMURA HIROSHI·Filed 2012·Granted Jul 2, 2013·9 cites·32 claims
- 0393US6122193ANon-volatile semiconductor memory capable of storing 1-bit data or multi-bit dataTOSHIBA KK·Filed 1999·Granted Sep 19, 2000·82 cites·17 claims
- 0492US10026491B2Semiconductor memory device and memory systemTOSHIBA MEMORY CORP·Filed 2017·Granted Jul 17, 2018·11 cites·17 claims
- 0591US8218373B2Semiconductor integrated circuit adapted to output pass/fail results of internal operationsNAKAMURA HIROSHI·Filed 2010·Granted Jul 10, 2012·8 cites·19 claims
- 0691US5371702ABlock erasable nonvolatile memory deviceTOSHIBA KK·Filed 1993·Granted Dec 6, 1994·89 cites·13 claims
- 0790US6512702B1Non-volatile semiconductor memory device and data erase controlling method for use thereinTOSHIBA KK·Filed 2000·Granted Jan 28, 2003·62 cites·17 claims
- 0888US5682346ANonvolatile semiconductor memory device having suitable writing efficiencyTOSHIBA KK·Filed 1996·Granted Oct 28, 1997·71 cites·19 claims
- 0987US5969557ADelay circuit, oscillation circuit and semiconductor memory deviceTOSHIBA KK·Filed 1997·Granted Oct 19, 1999·36 cites·42 claims
- 1086US7916555B2Semiconductor integrated circuit adapted to output pass/fail results of internal operationsTOSHIBA KK·Filed 2008·Granted Mar 29, 2011·7 cites·24 claims
- 1185US7023741B2Semiconductor integrated circuit adapted to output pass/fail results of internal operationsTOSHIBA KK·Filed 2002·Granted Apr 4, 2006·18 cites·19 claims
- 1284US7453739B2Semiconductor integrated circuit adapted to output pass/fail results of internal operationsTOSHIBA KK·Filed 2007·Granted Nov 18, 2008·7 cites·26 claims
- 1384US4287420AStereoscopic X-ray deviceTOSHIBA CORP·Filed 1979·Granted Sep 1, 1981·21 cites·9 claims
- 1481US6331945B1Non-volatile semiconductor memory capable of storing one-bit data or multi-bit dataTOSHIBA KK·Filed 2000·Granted Dec 18, 2001·24 cites·27 claims
- 1581US5627488ADelay circuit, oscillation circuit and semiconductor memory deviceTOSHIBA KK·Filed 1995·Granted May 6, 1997·44 cites·20 claims
- 1680US9870831B2Semiconductor integrated circuit adapted to output pass/fail results of internal operationsTOSHIBA MEMORY CORP·Filed 2016·Granted Jan 16, 2018·1 cites·19 claims
- 1778US6418052B1Nonvolatile semiconductor memory equipped with data latch circuits for transferring one-bit data or multi-bit dataTOSHIBA KK·Filed 2001·Granted Jul 9, 2002·19 cites·21 claims
- 1878US5436913ANon-volatile semiconductor memory device using successively longer write pulsesTOSHIBA KK·Filed 1993·Granted Jul 25, 1995·38 cites·10 claims
- 1978US4141606ARotating anode supporting structure for an x-ray tubeTOKYO SHIBAURA ELECTRIC CO·Filed 1976·Granted Feb 27, 1979·16 cites·2 claims
- 2075US7224621B2Semiconductor integrated circuit adapted to output pass/fail results of internal operationsTOSHIBA KK·Filed 2006·Granted May 29, 2007·4 cites·20 claims
- 2172US11295823B2Semiconductor integrated circuit adapted to output pass/fail results of internal operationsKIOXIA CORP·Filed 2020·Granted Apr 5, 2022·0 cites·20 claims
- 2270US7123515B2Semiconductor integrated circuit adapted to output pass/fail results of internal operationsTOSHIBA KK·Filed 2005·Granted Oct 17, 2006·3 cites·15 claims
- 2370US4243492AProcess for purifying crude olefin oxidesSHOWA DENKO KK·Filed 1977·Granted Jan 6, 1981·8 cites·7 claims
- 2467US8218374B2Semiconductor integrated circuit adapted to output pass/fail results of internal operationsNAKAMURA HIROSHI·Filed 2010·Granted Jul 10, 2012·1 cites·16 claims
- 2566US8111562B2Semiconductor storage device and method of reading data therefromYAMAMURA TOSHIO·Filed 2008·Granted Feb 7, 2012·5 cites·20 claims
- 2664US5615148ANonvolatile semiconductor memoryTOSHIBA KK·Filed 1996·Granted Mar 25, 1997·23 cites·9 claims
- 2763US9536610B2Semiconductor integrated circuit adapted to output pass/fail results of internal operationsTOSHIBA KK·Filed 2014·Granted Jan 3, 2017·0 cites·19 claims
- 2862US10741266B2Semiconductor integrated circuit adapted to output pass/fail results of internal operationsTOSHIBA MEMORY CORP·Filed 2019·Granted Aug 11, 2020·0 cites·17 claims
- 2958US10410731B2Semiconductor integrated circuit adapted to output pass/fail results of internal operationsTOSHIBA MEMORY CORP·Filed 2017·Granted Sep 10, 2019·0 cites·34 claims
- 3057US7894262B2Nonvolatile semiconductor storage device having guaranteed and backup blocksTOSHIBA KK·Filed 2008·Granted Feb 22, 2011·3 cites·20 claims
- 3154US8320200B2Semiconductor storage device and method of reading data therefromYAMAMURA TOSHIO·Filed 2011·Granted Nov 27, 2012·1 cites·10 claims
- 3253US8743625B2Semiconductor integrated circuit adapted to output pass/fail results of internal operationsTOSHIBA KK·Filed 2013·Granted Jun 3, 2014·0 cites·15 claims
- 3346US4188558AX-ray tubeTOKYO SHIBAURA ELECTRIC CO·Filed 1978·Granted Feb 12, 1980·4 cites·15 claims
- 3434US7301834B2Semiconductor memoryTOSHIBA KK·Filed 2003·Granted Nov 27, 2007·0 cites·21 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →