Inventor · disambiguated record
Tomoyuki Yoda
Also filed as: YODA TOMOYUKI
4 granted patents·7 pending applications·28 citations·filing 2004–2013
73Inventor score
Top patents by PatentIndex Score
11 records- 0175US8836065B2Solid-state imaging deviceTOSHIBA KK·Filed 2013·Granted Sep 16, 2014·7 cites·15 claims
- 0259US7024337B2System and method for analyzing noiseTOSHIBA KK·Filed 2004·Granted Apr 4, 2006·10 cites·16 claims
- 0358US7325217B2Automatic wiring method for the crosstalk reductionTOSHIBA KK·Filed 2004·Granted Jan 29, 2008·9 cites·20 claims
- 0455US8196077B2Cell-library-for-statistical-timing-analysis creating apparatus and statistical-timing analyzing apparatusYODA TOMOYUKI·Filed 2010·Granted Jun 5, 2012·2 cites·18 claims
- 0555US2014110771A1Solid-state imaging device and semiconductor deviceTOSHIBA KK·Filed 2013·Application pending·0 cites
- 0644US2009249272A1Statistical timing analyzer and statistical timing analysis methodTOSHIBA KK·Filed 2009·Application pending·0 cites
- 0735US2012246605A1Static timing analyzer, method for analyzing static timing and medium storing computer program for making computer processor analyze static timingKITAOKA MIYAKO·Filed 2011·Application pending·0 cites
- 0832US2013205273A1Power supply wiring design support method, power supply wiring design support apparatus, power supply wiring design support program and recording mediumYODA TOMOYUKI·Filed 2012·Application pending·0 cites
- 0930US2011295536A1Clock jitter analyzing method and apparatusYODA TOMOYUKI·Filed 2010·Application pending·0 cites
- 1028US2012072148A1Voltage drop analysis apparatus, voltage drop analysis method, and systemYODA TOMOYUKI·Filed 2011·Application pending·0 cites
- 1126US2005141315A1System and method for adjusting noiseFiled 2004·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Tomoyuki Yoda files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →