Inventor · disambiguated record
Travis S. Merrill
Also filed as: MERRILL TRAVIS S
3 granted patents·2 pending applications·14 citations·filing 2007–2013
65Inventor score
Technology areasG01R
Top patents by PatentIndex Score
5 records- 0178US8587383B2Measuring bias temperature instability induced ring oscillator frequency degradationBROCHU JR DAVID G·Filed 2011·Granted Nov 19, 2013·6 cites·20 claims
- 0269US8754655B2Test structure, method and circuit for simultaneously testing time dependent dielectric breakdown and electromigration or stress migrationBROCHU JR DAVID G·Filed 2011·Granted Jun 17, 2014·3 cites·25 claims
- 0363US7512506B2IC chip stress testingIBM·Filed 2007·Granted Mar 31, 2009·5 cites·14 claims
- 0440US2014195175A1Measuring dielectric breakdown in a dynamic modeIBM·Filed 2013·Application pending·0 cites
- 0533US2012187974A1Dual Stage Voltage Ramp Stress Test for Gate DielectricsBROCHU JR DAVID G·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →