Inventor · disambiguated record
Tsung-Hsien Han
Also filed as: HAN TSUNG-HSIEN
2 granted patents·5 pending applications·46 citations·filing 1998–2025
64Inventor score
Top patents by PatentIndex Score
7 records- 0161US2025327762A1Composite semiconductor inspection systemNANOSEEX INC·Filed 2024·Application pending·0 cites
- 0258US2025341480A1X-ray measurement system and x-ray measurement methodNANOSEEX INC·Filed 2024·Application pending·0 cites
- 0357US2025147195A1X-ray measurement system with high signal resolutionNANOSEEX INC·Filed 2024·Application pending·0 cites
- 0454US6136613AMethod for recycling monitoring control wafersUNITED SILICON INC·Filed 1998·Granted Oct 24, 2000·22 cites·8 claims
- 0552US6065869AMethod of in-line temperature monitoringUNITED SILICON INC·Filed 1999·Granted May 23, 2000·24 cites·21 claims
- 0648US2025334530A1X-ray reflection analysis system applying multiple x-ray beamsNANOSEEX INC·Filed 2025·Application pending·0 cites
- 0748US2025377318A1X-ray reflection analysis system and x-reflection analysis method utilizing multi-order mode signalsNANOSEEX INC·Filed 2025·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →