Inventor · disambiguated record
Tsung-Chi Hsieh
Also filed as: HSIEH TSUNG-CHI
10 granted patents·2 pending applications·147 citations·filing 1998–2004
89Inventor score
Top patents by PatentIndex Score
12 records- 0185US6513542B1Liquid supply or drain pipe equipped with a leakage detectorTAIWAN SEMICONDUCTOR MFG·Filed 2000·Granted Feb 4, 2003·30 cites·16 claims
- 0270US6489227B1Method of etching a polysilicon layer during the stripping of the photoresist shape used as an etch mask to create an opening to an underlying fuse structureTAIWAN SEMICONDUCTOR MFG·Filed 2001·Granted Dec 3, 2002·17 cites·20 claims
- 0367US6238160B1Method for transporting and electrostatically chucking a semiconductor wafer or the likeTAIWAN SEMICONDUCTOR MFG·Filed 1998·Granted May 29, 2001·36 cites·4 claims
- 0463US6185085B1System for transporting and electrostatically chucking a semiconductor wafer or the likeTAIWAN SEMICONDUCTOR MFG·Filed 1998·Granted Feb 6, 2001·29 cites·8 claims
- 0562US7204751B2Method and apparatus for filtering contaminantsTAIWAN SEMICONDUCTOR MFG·Filed 2003·Granted Apr 17, 2007·11 cites·17 claims
- 0659US6752897B2Wet etch system with overflow particle removing featureTAIWAN SEMICONDUCTOR MFG·Filed 2002·Granted Jun 22, 2004·7 cites·20 claims
- 0759US6601986B2Fluid mixing apparatusTAIWAN SEMICONDUCTOR MFG·Filed 2001·Granted Aug 5, 2003·9 cites·18 claims
- 0852US6576483B1Backside cannelure to provide for wafer shift detectionTAIWAN SEMICONDUCTOR MFG·Filed 2002·Granted Jun 10, 2003·7 cites·20 claims
- 0947US2005230407A1Toxic waste receptacleFANG CHUN-LI·Filed 2004·Application pending·0 cites
- 1037US6908813B2Method of forming tiny silicon nitride spacer for flash EPROM by fully wet etching technologyTAIWAN SEMICONDUCTOR MFG·Filed 2003·Granted Jun 21, 2005·1 cites·28 claims
- 1136US2004192064A1Method and apparatus for homogeneous mixingTAIWAN SEMICONDUCTOR MFG·Filed 2003·Application pending·0 cites
- 1233US6971270B2Method and apparatus for measuring gripping strength of a vacuum wandTAIWAN SEMICONDUCTOR MFG·Filed 2004·Granted Dec 6, 2005·0 cites·25 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →