Inventor · disambiguated record
Tsu-Wen Huang
Also filed as: HUANG TSU-WEN
4 granted patents·0 citations·filing 2021–2023
53Inventor score
Files withNANYA TECHNOLOGY CORP4
Top patents by PatentIndex Score
4 records- 0167US12436469B2Measuring method for measuring overlay shift and non-transient computer readable storage mediumNANYA TECHNOLOGY CORP·Filed 2023·Granted Oct 7, 2025·0 cites·20 claims
- 0243US12014961B2Method of semiconductor overlay measuring and method of semiconductor structure manufacturingNANYA TECHNOLOGY CORP·Filed 2021·Granted Jun 18, 2024·0 cites·15 claims
- 0342US12191215B2Manufacturing and measuring system for semiconductor structuresNANYA TECHNOLOGY CORP·Filed 2021·Granted Jan 7, 2025·0 cites·13 claims
- 0439US12431393B2Manufacturing method for semiconductor structuresNANYA TECHNOLOGY CORP·Filed 2021·Granted Sep 30, 2025·0 cites·11 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →