Inventor · disambiguated record
Tsung-Yang Hung
Also filed as: HUNG TSUNG-YANG
14 granted patents·2 pending applications·182 citations·filing 1998–2023
91Inventor score
Files withTAIWAN SEMICONDUCTOR MFG CO LTD8TAIWAN SEMICONDUCTOR MFG4HUNG TSUNG-YANG2IND TECH RES INST2
Top patents by PatentIndex Score
16 records- 0196US7330702B2Method and apparatus for inter-chip wireless communicationTAIWAN SEMICONDUCTOR MFG·Filed 2005·Granted Feb 12, 2008·89 cites·20 claims
- 0295US11199508B1Failure analysis method with improved detection accuracy for advanced technology nodeTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Dec 14, 2021·5 cites·20 claims
- 0387US7786771B2Phase lock loop (PLL) with gain controlTAIWAN SEMICONDUCTOR MFG·Filed 2008·Granted Aug 31, 2010·16 cites·19 claims
- 0483US8125235B2Apparatus for mass die testingHUNG TSUNG-YANG·Filed 2010·Granted Feb 28, 2012·6 cites·20 claims
- 0581US11579191B2Method and system for testing an integrated circuitTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Feb 14, 2023·1 cites·20 claims
- 0681US8237462B2Method for wafer-level testing of integrated circuitsHUNG TSUNG-YANG·Filed 2009·Granted Aug 7, 2012·13 cites·20 claims
- 0777US12007438B2Method and system for testing an integrated circuitTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Jun 11, 2024·0 cites·20 claims
- 0877US2024094288A1Circuit screening system and circuit screening methodTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Application pending·0 cites
- 0975US11852682B2Circuit screening system and circuit screening methodTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Dec 26, 2023·0 cites·20 claims
- 1071US12248022B2Method and apparatus for detecting defective logic devicesTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Mar 11, 2025·0 cites·20 claims
- 1168US7894173B2Enhancing bandwidth of ESD network using transformersTAIWAN SEMICONDUCTOR MFG·Filed 2008·Granted Feb 22, 2011·5 cites·20 claims
- 1267US11500016B2Circuit screening system and circuit screening methodTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Nov 15, 2022·0 cites·19 claims
- 1359US6370361B1Transceiver with a receive/transmit fast switch functionIND TECH RES INST·Filed 1999·Granted Apr 9, 2002·28 cites·16 claims
- 1455US11675004B2Method and apparatus for detecting defective logic devicesTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Jun 13, 2023·0 cites·20 claims
- 1548US6054952ABroad-band microstrip antennaIND TECH RES INST·Filed 1998·Granted Apr 25, 2000·19 cites·23 claims
- 1641US2008116910A1Apparatus for mass die testingTAIWAN SEMICONDUCTOR MFG·Filed 2006·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →