Inventor · disambiguated record
Tsuyoshi Inuma
Also filed as: INUMA TSUYOSHI
9 granted patents·3 pending applications·46 citations·filing 2007–2024
83Inventor score
Top patents by PatentIndex Score
12 records- 0191US7898272B2Probe cardNHK SPRING CO LTD·Filed 2007·Granted Mar 1, 2011·23 cites·8 claims
- 0280US11782074B2Probe unitNHK SPRING CO LTD·Filed 2019·Granted Oct 10, 2023·2 cites·13 claims
- 0380US8049525B2Parallelism adjusting mechanism of probe cardNHK SPRING CO LTD·Filed 2007·Granted Nov 1, 2011·8 cites·11 claims
- 0480US2024302409A1Measurement unitNHK SPRING CO LTD·Filed 2024·Application pending·0 cites
- 0578US8149008B2Probe card electrically connectable with a semiconductor waferYAMADA YOSHIO·Filed 2008·Granted Apr 3, 2012·10 cites·3 claims
- 0675US2025035699A1Contact probe, probe holder and probe unitNHK SPRING CO LTD·Filed 2024·Application pending·0 cites
- 0769US2022196704A1Measurement unitNHK SPRING CO LTD·Filed 2021·Application pending·0 cites
- 0863US12188977B2Contact probe, probe holder and probe unitNHK SPRING CO LTD·Filed 2021·Granted Jan 7, 2025·0 cites·10 claims
- 0955US11293946B2Conductive contactor unitNHK SPRING CO LTD·Filed 2018·Granted Apr 5, 2022·1 cites·8 claims
- 1053US11320461B2Probe unitNHK SPRING CO LTD·Filed 2018·Granted May 3, 2022·0 cites·10 claims
- 1152US8456184B2Probe card for a semiconductor waferYAMADA YOSHIO·Filed 2008·Granted Jun 4, 2013·2 cites·13 claims
- 1251US11994535B2Probe unitNHK SPRING CO LTD·Filed 2019·Granted May 28, 2024·0 cites·5 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →