Inventor · disambiguated record

Tsuyoshi Jouno

Also filed as: JOUNO TSUYOSHI

2 granted patents·51 citations·filing 1992–1993

65Inventor score

Technology areasG06F

Files withHITACHI LTD2

Top patents by PatentIndex Score

2 records

0160US5228139ASemiconductor integrated circuit device with test mode for testing CPU using external signalHITACHI LTD·Filed 1992·Granted Jul 13, 1993·34 cites·22 claims
0246US5581698ASemiconductor integrated circuit device with test mode for testing CPU using external SignalHITACHI LTD·Filed 1993·Granted Dec 3, 1996·17 cites·17 claims

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →