Inventor · disambiguated record
Tsuyoshi Kanao
Also filed as: KANAO TSUYOSHI
2 granted patents·3 pending applications·114 citations·filing 1999–2025
64Inventor score
Top patents by PatentIndex Score
5 records- 0190US6194907B1Prober and electric evaluation method of semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 1999·Granted Feb 27, 2001·110 cites·16 claims
- 0253US2023411200A1Manufacturing method of semiconductor device, method of testing the semiconductor device and wafer holding memberRENESAS ELECTRONICS CORP·Filed 2023·Application pending·0 cites
- 0352US2025329589A1Method of manufacturing semiconductor device and product history management method for semiconductor deviceRENESAS ELECTRONICS CORP·Filed 2025·Application pending·0 cites
- 0447US2025329661A1Method of manufacturing semiconductor device and product history management method for semiconductor deviceRENESAS ELECTRONICS CORP·Filed 2025·Application pending·0 cites
- 0537US6747466B2Substrate testing apparatus and substrate testing methodRENESAS TECH CORP·Filed 2001·Granted Jun 8, 2004·4 cites·6 claims
Join the waitlist — get patent alerts
Get an alert when Tsuyoshi Kanao files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →