Inventor · disambiguated record
Tsuyoshi Kouchi
Also filed as: KOUCHI TSUYOSHI
6 granted patents·6 pending applications·7 citations·filing 2002–2017
72Inventor score
Top patents by PatentIndex Score
12 records- 0180US9123534B2Semiconductor device and method of manufacturing the sameSUMITOMO ELECTRIC INDUSTRIES·Filed 2014·Granted Sep 1, 2015·4 cites·7 claims
- 0267US10038086B2Process for forming a high electron mobility transistorSUMITOMO ELECTRIC INDUSTRIES·Filed 2017·Granted Jul 31, 2018·1 cites·7 claims
- 0352US2014346530A1Semiconductor device and method of manufacturing the sameSUMITOMO ELECTRIC INDUSTRIES·Filed 2014·Application pending·0 cites
- 0450US9355843B2Semiconductor device and method of manufacturing the sameSUMITOMO ELECTRIC INDUSTRIES·Filed 2015·Granted May 31, 2016·0 cites·5 claims
- 0549US2018053648A1Method of manufacturing semiconductor deviceSUMITOMO ELECTRIC INDUSTRIES·Filed 2017·Application pending·0 cites
- 0646US9029873B2Semiconductor device including an aluminum nitride layer having a calculated area-averaged circularity and a method of manufacturing the deviceSUMITOMO ELECTRIC INDUSTRIES·Filed 2014·Granted May 12, 2015·0 cites·18 claims
- 0745US9159821B2Nitride semiconductor device with limited instantaneous current reductionSUMITOMO ELECTRIC INDUSTRIES·Filed 2013·Granted Oct 13, 2015·0 cites·15 claims
- 0845US2012315742A1Method for forming nitride semiconductor deviceYUI KEIICHI·Filed 2012·Application pending·0 cites
- 0945US2016111274A1Method for forming nitride semiconductor deviceSUMITOMO ELECTRIC INDUSTRIES·Filed 2015·Application pending·0 cites
- 1036US6661557B2Optical modulatorJAPAN AVIATION ELECTRON·Filed 2002·Granted Dec 9, 2003·2 cites·8 claims
- 1132US2015279658A1Method of growing nitride semiconductor deviceSUMITOMO ELECTRIC INDUSTRIES·Filed 2015·Application pending·0 cites
- 1231US2015279942A1Process to produce nitride semiconductor deviceSUMITOMO ELECTRIC INDUSTRIES·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →