Inventor · disambiguated record
Tsung-Jun Lee
Also filed as: LEE TSUNG-JUN
3 granted patents·5 citations·filing 2014–2016
56Inventor score
Top patents by PatentIndex Score
3 records- 0172US9435863B2Integrated circuit testing interface on automatic test equipmentSITRONIX TECHNOLOGY CORP·Filed 2014·Granted Sep 6, 2016·3 cites·16 claims
- 0263US9506974B2Active probe cardSITRONIX TECHNOLOGY CORP·Filed 2014·Granted Nov 29, 2016·2 cites·6 claims
- 0326US9952277B2Test device and method using single probe to test multiple pads of chipSYNC TECH SYSTEM CORP·Filed 2016·Granted Apr 24, 2018·0 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →