Inventor · disambiguated record
Tsutomu Mizuguchi
Also filed as: MIZUGUCHI TSUTOMU
11 granted patents·2 pending applications·83 citations·filing 2002–2021
87Inventor score
Top patents by PatentIndex Score
13 records- 0192US8169608B2Optical characteristic measurement device and optical characteristic measurement method suitable for spectrum measurementSANO HIROYUKI·Filed 2011·Granted May 1, 2012·28 cites·3 claims
- 0291US8169607B2Optical characteristic measurement device and optical characteristic measurement method suitable for spectrum measurementSANO HIROYUKI·Filed 2009·Granted May 1, 2012·29 cites·6 claims
- 0387US7528967B2Optical characteristic measuring apparatus and measuring method using light reflected from object to be measuredOTSUKA DENSHI KK·Filed 2008·Granted May 5, 2009·16 cites·13 claims
- 0481US10222261B2Optical characteristic measurement system and calibration method for optical characteristic measurement systemOTSUKA DENSHI KK·Filed 2016·Granted Mar 5, 2019·3 cites·10 claims
- 0567US8164632B2Method and apparatus for measuring moving picture response curveENAMI YOSHI·Filed 2007·Granted Apr 24, 2012·4 cites·20 claims
- 0664US10795067B2Confocal optical system-based measurement apparatus and method for manufacturing confocal optical system-based measurement apparatusOTSUKA DENSHI KK·Filed 2019·Granted Oct 6, 2020·1 cites·5 claims
- 0760US10422694B2Optical characteristic measurement system and calibration method for optical characteristic measurement systemOTSUKA DENSHI KK·Filed 2019·Granted Sep 24, 2019·0 cites·12 claims
- 0859US10422695B2Optical characteristic measurement system and calibration method for optical characteristic measurement systemOTSUKA DENSHI KK·Filed 2019·Granted Sep 24, 2019·0 cites·5 claims
- 0955US9163985B2Spectral characteristic measurement apparatus and spectral characteristic measurement methodOTSUKA DENSHI KK·Filed 2013·Granted Oct 20, 2015·1 cites·6 claims
- 1054US6750967B2Light scattering measuring probeOTSUKA DENSHI KK·Filed 2002·Granted Jun 15, 2004·1 cites·8 claims
- 1151US2008238820A1Motion picture image processing system and motion picture image processing methodOTSUKA DENSHI KK·Filed 2008·Application pending·0 cites
- 1249US2025334525A1Optical measurement system and optical measurement methodOTSUKA DENSHI KK·Filed 2021·Application pending·0 cites
- 1337US9921149B2Optical measurement apparatus and optical measurement methodOTSUKA DENSHI KK·Filed 2015·Granted Mar 20, 2018·0 cites·14 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →