Inventor · disambiguated record
Tsuyoshi Ohno
Also filed as: OHNO TSUYOSHI
11 granted patents·2 pending applications·92 citations·filing 1992–2009
88Inventor score
Top patents by PatentIndex Score
13 records- 0175US6828820B2Method and circuit for producing control signal for impedance matchingNEC ELECTRONICS CORP·Filed 2003·Granted Dec 7, 2004·24 cites·23 claims
- 0266US5534785AIntegrated circuit bare chip carrierFUJITSU LTD·Filed 1995·Granted Jul 9, 1996·30 cites·6 claims
- 0357US6847120B2Flip chip semiconductor device having signal pads arranged outside of power supply padsNEC ELECTRONICS CORP·Filed 2001·Granted Jan 25, 2005·8 cites·30 claims
- 0450US5973544AIntermediate potential generation circuitNEC CORP·Filed 1998·Granted Oct 26, 1999·14 cites·17 claims
- 0547US6489815B2Low-noise buffer circuit that suppresses current variationNEC CORP·Filed 2001·Granted Dec 3, 2002·4 cites·18 claims
- 0644US8778205B2Processing method and processing systemOHNO TSUYOSHI·Filed 2009·Granted Jul 15, 2014·0 cites·2 claims
- 0744US6601225B2Semiconductor device having definite size of input/output blocks and its designing methodNEC ELECTRONICS CORP·Filed 2001·Granted Jul 29, 2003·2 cites·14 claims
- 0841US2007132876A1Solid-state image pickup device, color separation image pickup optical system and image pickup apparatusOHNO TSUYOSHI·Filed 2006·Application pending·0 cites
- 0937US2004260420A1Processing method and processing systemTOKYO ELECTRON LTD·Filed 2004·Application pending·0 cites
- 1036US8085335B2Image pickup apparatus with a fixed aperture stop having an aperture with different, repetitive first and second wave patternsOHNO TSUYOSHI·Filed 2008·Granted Dec 27, 2011·0 cites·8 claims
- 1135US5250416AMethod for highly sensitive determination of NADH using kinaseNODA INST FOR SCIENT RSEARCH·Filed 1992·Granted Oct 5, 1993·8 cites·2 claims
- 1231US5227299ANadh kinase and a process for producing the sameNODA INST FOR SCIENTIFIC RES·Filed 1992·Granted Jul 13, 1993·2 cites·4 claims
- 1328US6351015B1Transistor device of MOS structure in which variation of output impedance resulting from manufacturing error is reducedNEC CORP·Filed 1999·Granted Feb 26, 2002·0 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →