Inventor · disambiguated record
Tsuyoshi Takeuchi
Also filed as: TAKEUCHI TSUYOSHI
12 granted patents·4 pending applications·62 citations·filing 2003–2020
88Inventor score
Files withOMRON TATEISI ELECTRONICS CO9NISSHIN SPINNING2FUJITSU LTD1KURATANI SHINICHI1MAEDA MUNENORI1
Top patents by PatentIndex Score
16 records- 0186US10558048B2Image display system, method for controlling image display system, image distribution system and head-mounted displayMELEAP INC·Filed 2016·Granted Feb 11, 2020·15 cites·7 claims
- 0281US8856761B2Instruction processing method, instruction processing apparatus, and instruction processing programMAEDA MUNENORI·Filed 2012·Granted Oct 7, 2014·7 cites·9 claims
- 0381US7361701B2Aliphatic polyester composition, a molded article thereof and a method for controlling biodegradation rate using the same compositionNISSHIN SPINNING·Filed 2003·Granted Apr 22, 2008·15 cites·8 claims
- 0479US10509068B2Test device for a photovoltaic system having solar cell stringOMRON TATEISI ELECTRONICS CO·Filed 2016·Granted Dec 17, 2019·2 cites·17 claims
- 0579US6846860B2Biodegradable plastic composition, a molded article thereof and a method for controlling biodegradation rateNISSHIN SPINNING·Filed 2003·Granted Jan 25, 2005·13 cites·20 claims
- 0668US9026340B2Air-fuel ratio control system and air-fuel ratio control method of internal combustion engineKURATANI SHINICHI·Filed 2011·Granted May 5, 2015·3 cites·12 claims
- 0767US10305424B2Solar photovoltaic system inspection method and inspection apparatusOMRON TATEISI ELECTRONICS CO·Filed 2015·Granted May 28, 2019·1 cites·17 claims
- 0867US8276820B2Information notification method and information notification systemSAO MASATAKA·Filed 2010·Granted Oct 2, 2012·6 cites·12 claims
- 0954US2019288642A1I-v curve measurement deviceOMRON TATEISI ELECTRONICS CO·Filed 2019·Application pending·0 cites
- 1053US10374548B2Inspection support apparatus and control method thereof, inspection system, and control programOMRON TATEISI ELECTRONICS CO·Filed 2017·Granted Aug 6, 2019·0 cites·18 claims
- 1153US2019190444A1Solar cell array inspection system, power conditioner, and solar cell array inspection methodOMRON TATEISI ELECTRONICS CO·Filed 2018·Application pending·0 cites
- 1247US2022170987A1Abnormality diagnosis device and abnormality diagnosis methodOMRON TATEISI ELECTRONICS CO·Filed 2020·Application pending·0 cites
- 1343US10727357B2Photovoltaic power generation system inspection apparatus and inspection methodOMRON TATEISI ELECTRONICS CO·Filed 2017·Granted Jul 28, 2020·0 cites·9 claims
- 1442US11009559B2Leakage current calculation methodOMRON TATEISI ELECTRONICS CO·Filed 2018·Granted May 18, 2021·0 cites·4 claims
- 1541US2014068029A1Information processing system, identification information decision device and identification information decision methodFUJITSU LTD·Filed 2013·Application pending·0 cites
- 1639US10782359B2Leakage current calculation device and leakage current calculation methodOMRON TATEISI ELECTRONICS CO·Filed 2016·Granted Sep 22, 2020·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →