Inventor · disambiguated record
Tsuyoshi Toyama
Also filed as: TOYAMA TSUYOSHI
18 granted patents·2 pending applications·1,055 citations·filing 1982–2019
96Inventor score
Top patents by PatentIndex Score
20 records- 0198US5262984ANon-volatile memory device capable of storing multi-state dataMITSUBISHI ELECTRIC CORP·Filed 1989·Granted Nov 16, 1993·185 cites·13 claims
- 0298US5021999ANon-volatile semiconductor memory device with facility of storing tri-level dataMITSUBISHI ELECTRIC CORP·Filed 1988·Granted Jun 4, 1991·392 cites·16 claims
- 0392US4779272ATestable variable-threshold non-volatile semiconductor memoryMITSUBISHI ELECTRIC CORP·Filed 1986·Granted Oct 18, 1988·106 cites·15 claims
- 0489US5003205ABuffer circuit used in a semiconductor device operating by different supply potentials and method of operating the sameMITSUBISHI ELECTRIC CORP·Filed 1989·Granted Mar 26, 1991·42 cites·12 claims
- 0585US10484184B2Vehicle system and authentication methodTOYOTA MOTOR CO LTD·Filed 2016·Granted Nov 19, 2019·6 cites·13 claims
- 0683US5172339ASemiconductor memory device having error checking and correcting circuit and operating method thereforMITSUBISHI ELECTRIC CORP·Filed 1990·Granted Dec 15, 1992·101 cites·12 claims
- 0775US4958352ASemiconductor memory device with error check and correcting functionMITSUBISHI ELECTRIC CORP·Filed 1988·Granted Sep 18, 1990·51 cites·15 claims
- 0873US4827452ASemiconductor memory including a selectively disabled redunancy circuitMITSUBISHI ELECTRIC CORP·Filed 1986·Granted May 2, 1989·30 cites·8 claims
- 0965US5182725ANonvolatile semiconductor memory device with reduced variation in source potential of floating gate type memory transistor and operating method thereforMITSUBISHI ELECTRIC CORP·Filed 1991·Granted Jan 26, 1993·25 cites·6 claims
- 1063US5097152ABuffer circuit used in a semiconductor device operating by different supply potentials and method of operating the sameMITSUBISHI ELECTRIC CORP·Filed 1991·Granted Mar 17, 1992·16 cites·12 claims
- 1162US10397244B2System and method for detecting attack when sensor and traffic information are inconsistentTOYOTA MOTOR CO LTD·Filed 2016·Granted Aug 27, 2019·1 cites·10 claims
- 1258US5195099ASemiconductor memory device having improved error correcting circuitMITSUBISHI ELECTRIC CORP·Filed 1992·Granted Mar 16, 1993·19 cites·9 claims
- 1358US5105386ANonvolatile semiconductor memory device with reduced variation in source potential of floating gate type memory transistors and operating method thereforMITSUBISHI ELECTRIC CORP·Filed 1990·Granted Apr 14, 1992·19 cites·2 claims
- 1457US2019334924A1System and method for detecting attack when sensor and traffic information are inconsistentTOYOTA MOTOR CO LTD·Filed 2019·Application pending·0 cites
- 1556US5058071ASemiconductor memory device having means for repairing the memory device with respect to possible defective memory portionsMITSUBISHI ELECTRIC CORP·Filed 1991·Granted Oct 15, 1991·18 cites·21 claims
- 1651US4949305AErasable read-only semiconductor memory deviceMITSUBISHI ELECTRIC CORP·Filed 1988·Granted Aug 14, 1990·12 cites·33 claims
- 1748US5262342AMethod of making a semiconductor memory device having error checking/correcting functionsMITSUBISHI ELECTRIC CORP·Filed 1991·Granted Nov 16, 1993·19 cites·1 claims
- 1844US5107313AFloating gate type semiconductor memory deviceMITSUBISHI ELECTRIC CORP·Filed 1988·Granted Apr 21, 1992·9 cites·1 claims
- 1934US2013278156A1Light-emitting diode lighting apparatus, illuminating apparatus and illuminating methodHANYUDA YUMI·Filed 2011·Application pending·0 cites
- 2033US4651186AField effect transistor with improved withstand voltage characteristicMITSUBISHI ELECTRIC CORP·Filed 1982·Granted Mar 17, 1987·4 cites·22 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →