Inventor · disambiguated record
Tsuneyuki Urakami
Also filed as: URAKAMI TSUNEYUKI
26 granted patents·368 citations·filing 1988–2000
97Inventor score
Top patents by PatentIndex Score
26 records- 0185US4958354AApparatus for stabilizing the intensity of lightHAMAMATSU PHOTONICS KK·Filed 1989·Granted Sep 18, 1990·34 cites·5 claims
- 0282US6567165B1Concentration measuring method and apparatus for absorption component in scattering mediumHAMAMATSU PHOTONICS KK·Filed 2000·Granted May 20, 2003·22 cites·22 claims
- 0375US5640247AMethod for measuring internal information in a scattering medium and apparatus for the sameHAMAMATSU PHOTONICS KK·Filed 1994·Granted Jun 17, 1997·42 cites·25 claims
- 0475US5583444AVoltage detection apparatusHAMAMATSU PHOTONICS KK·Filed 1996·Granted Dec 10, 1996·33 cites·12 claims
- 0571US5499190ASystem for measuring timing relationship between two signalsHAMAMATSU PHOTONICS KK·Filed 1993·Granted Mar 12, 1996·30 cites·26 claims
- 0663US5811805ACharged particle guide apparatus and image viewing apparatus for charged particle microscope using the sameJAPAN RES DEV CORP·Filed 1996·Granted Sep 22, 1998·18 cites·20 claims
- 0760US5198921ALight amplifying polarizerHAMAMATSU PHOTONICS KK·Filed 1991·Granted Mar 30, 1993·20 cites·7 claims
- 0856US5317577AOptical wavelength shifter using nonlinear refractive medium disposed interiorly of laser resonatorHAMAMATSU PHOTONICS KK·Filed 1992·Granted May 31, 1994·20 cites·8 claims
- 0955US5274651AOptical modulator with nonlinear medium disposed interiorly of laser resonatorHAMAMATSU PHOTONICS KK·Filed 1992·Granted Dec 28, 1993·15 cites·18 claims
- 1055US5168164AOptical waveform measuring deviceHAMAMATSU PHOTONICS KK·Filed 1992·Granted Dec 1, 1992·18 cites·27 claims
- 1155US5124551AApparatus for measuring the temporal correlation of fundamental particlesHAMAMATSU PHOTONICS KK·Filed 1990·Granted Jun 23, 1992·15 cites·13 claims
- 1254US5491329APhotodetecting apparatus having intensity tuneable light irradiating unitHAMAMATSU PHOTONICS KK·Filed 1994·Granted Feb 13, 1996·17 cites·18 claims
- 1349US5025142ALight waveform changing apparatus using an optical amplifierHAMAMATSU PHOTONICS KK·Filed 1989·Granted Jun 18, 1991·14 cites·23 claims
- 1446US4994663ALight intensity correlating apparatusHAMAMATSU PHOTONICS KK·Filed 1989·Granted Feb 19, 1991·9 cites·9 claims
- 1543US5353149AApparatus for affecting time-space conversion on a light signal changing at ultra-high speedHAMAMATSU PHOTONICS KK·Filed 1993·Granted Oct 4, 1994·11 cites·25 claims
- 1642US5237388APolarized light measuring apparatus and phase plate measuring apparatusHAMAMATSU PHOTONICS KK·Filed 1991·Granted Aug 17, 1993·10 cites·14 claims
- 1741US5420686APolarization interferometer optical voltage detector utilizing movement of interference fringeHAMAMATSU PHOTONICS KK·Filed 1994·Granted May 30, 1995·8 cites·22 claims
- 1835US5384638ASampling-type optical voltage detector utilizing movement of interference fringeHAMAMATSU PHOTONICS KK·Filed 1992·Granted Jan 24, 1995·5 cites·15 claims
- 1935US4967080AApparatus for measuring the temporal correlation of fundamental particlesHAMAMATSU PHOTONICS KK·Filed 1988·Granted Oct 30, 1990·3 cites·10 claims
- 2033US5444365AVoltage measuring apparatus having an electro-optic memberHAMAMATSU PHOTONICS KK·Filed 1993·Granted Aug 22, 1995·3 cites·9 claims
- 2133US5319654APulsed laser beam source deviceHAMAMATSU PHOTONICS KK·Filed 1993·Granted Jun 7, 1994·3 cites·10 claims
- 2233US5307199AOptical apparatusHAMAMATSU PHOTONICS KK·Filed 1991·Granted Apr 26, 1994·4 cites·31 claims
- 2333US5220579APulse laserHAMAMATSU PHOTONICS KK·Filed 1991·Granted Jun 15, 1993·3 cites·10 claims
- 2431US5774223AOptical measuring method and an optical measuring apparatus for determining the internal structure of an objectHAMAMATSU PHOTONICS KK·Filed 1996·Granted Jun 30, 1998·8 cites·18 claims
- 2531US5703491AVoltage detection apparatusHAMAMATSU PHOTONICS KK·Filed 1996·Granted Dec 30, 1997·2 cites·11 claims
- 2630US4980632AElectrical signal observing deviceHAMAMATSU PHOTONICS KK·Filed 1989·Granted Dec 25, 1990·1 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →