Inventor · disambiguated record
Tsang-Po Yang
Also filed as: YANG TSANG-PO
11 granted patents·1 pending application·5 citations·filing 2018–2021
81Inventor score
Files withNANYA TECHNOLOGY CORP12
Top patents by PatentIndex Score
12 records- 0193US11393731B2Semiconductor structureNANYA TECHNOLOGY CORP·Filed 2020·Granted Jul 19, 2022·3 cites·9 claims
- 0281US11417574B2Semiconductor device with testing structure and method for fabricating the sameNANYA TECHNOLOGY CORP·Filed 2020·Granted Aug 16, 2022·1 cites·16 claims
- 0369US11699624B2Semiconductor structure with test structureNANYA TECHNOLOGY CORP·Filed 2021·Granted Jul 11, 2023·0 cites·7 claims
- 0468US10692811B1Semiconductor structureNANYA TECHNOLOGY CORP·Filed 2018·Granted Jun 23, 2020·1 cites·12 claims
- 0564US11456224B2Semiconductor structure with test structureNANYA TECHNOLOGY CORP·Filed 2020·Granted Sep 27, 2022·0 cites·8 claims
- 0663US11024553B2Semiconductor structure and manufacturing method thereofNANYA TECHNOLOGY CORP·Filed 2020·Granted Jun 1, 2021·0 cites·7 claims
- 0762US11876025B2Semiconductor structureNANYA TECHNOLOGY CORP·Filed 2021·Granted Jan 16, 2024·0 cites·14 claims
- 0856US10825744B2Semiconductor structure and manufacturing method thereofNANYA TECHNOLOGY CORP·Filed 2018·Granted Nov 3, 2020·0 cites·8 claims
- 0955US11569228B2Semiconductor structure and method of manufacturing the sameNANYA TECHNOLOGY CORP·Filed 2021·Granted Jan 31, 2023·0 cites·19 claims
- 1049US11237205B2Test array structure, wafer structure and wafer testing methodNANYA TECHNOLOGY CORP·Filed 2020·Granted Feb 1, 2022·0 cites·11 claims
- 1148US11410893B1Semiconductor structureNANYA TECHNOLOGY CORP·Filed 2021·Granted Aug 9, 2022·0 cites·14 claims
- 1240US2020211968A1Semiconductor structure and manufacturing method thereofNANYA TECHNOLOGY CORP·Filed 2019·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →