Inventor · disambiguated record
Tuomo Ylitalo
Also filed as: YLITALO TUOMO
1 granted patent·1 pending application·0 citations·filing 2015–2018
5Inventor score
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2 records- 0134US2018256089A1Assessment system and method for determining at least one of macro-topology, milli-topology, micro-topology and nano-topologyUNIV OF OULU·Filed 2018·Application pending·0 cites
- 0225US10234266B2Method for calibrating 3D imaging and system for 3D imagingABO AKADEMI ABO AKADEMI UNIV·Filed 2015·Granted Mar 19, 2019·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →