Inventor · disambiguated record
Tzu-Tu Chao
Also filed as: CHAO TZU-TU
3 granted patents·1 pending application·1 citations·filing 2020–2025
51Inventor score
Technology areasG01R
Top patents by PatentIndex Score
4 records- 0188US11841381B2Wafer inspection method and inspection apparatusCHROMA ATE INC·Filed 2022·Granted Dec 12, 2023·1 cites·19 claims
- 0283US2025298057A1Wafer inspection apparatusCHROMA ATE INC·Filed 2025·Application pending·0 cites
- 0374US12345741B2Wafer inspection method and inspection apparatusCHROMA ATE INC·Filed 2022·Granted Jul 1, 2025·0 cites·3 claims
- 0440US11573265B2Electrical component testing method and test probeCHANG MIN HUNG·Filed 2020·Granted Feb 7, 2023·0 cites·8 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →