Inventor · disambiguated record
Tzung-Te Chen
Also filed as: CHEN TZUNG-TE
14 granted patents·50 citations·filing 2011–2021
88Inventor score
Top patents by PatentIndex Score
14 records- 0193US10039169B2Light source apparatusIND TECH RES INST·Filed 2017·Granted Jul 31, 2018·23 cites·19 claims
- 0289US10485070B2Light source apparatus and display apparatusIND TECH RES INST·Filed 2018·Granted Nov 19, 2019·11 cites·16 claims
- 0384US10271410B1Method, device and computer program product for controlling lightsIND TECH RES INST·Filed 2018·Granted Apr 23, 2019·7 cites·18 claims
- 0471US9970880B2Apparatus for measuring a curvature of a thin film and the method thereofIND TECH RES INST·Filed 2016·Granted May 15, 2018·2 cites·23 claims
- 0567US9992842B2Illumination system and method for developing target visual perception of an objectIND TECH RES INST·Filed 2016·Granted Jun 5, 2018·1 cites·21 claims
- 0666US10838253B2Light source apparatus and display apparatusIND TECH RES INST·Filed 2019·Granted Nov 17, 2020·0 cites·12 claims
- 0764US9523572B2Thin-film curvature measurement apparatus and method thereofIND TECH RES INST·Filed 2014·Granted Dec 20, 2016·2 cites·22 claims
- 0863US9726713B2Testing method and testing system for semiconductor elementIND TECH RES INST·Filed 2013·Granted Aug 8, 2017·2 cites·10 claims
- 0963US9557368B2Method of measuring thermal electric characteristics of semiconductor deviceWANG CHIEN-PING·Filed 2012·Granted Jan 31, 2017·2 cites·19 claims
- 1058US11948531B2Light source device and display device alternately emitting light beamsIND TECH RES INST·Filed 2021·Granted Apr 2, 2024·0 cites·26 claims
- 1154US10820387B2Light source apparatus and display apparatusAVERTRONICS INC·Filed 2019·Granted Oct 27, 2020·0 cites·23 claims
- 1241US9341669B2Testing apparatusIND TECH RES INST·Filed 2013·Granted May 17, 2016·0 cites·24 claims
- 1337US9110125B2Method and apparatus for detecting relationship between thermal and electrical properties of semiconductor deviceWANG CHIEN-PING·Filed 2012·Granted Aug 18, 2015·0 cites·12 claims
- 1433US8773158B2Inspection methodWANG CHIEN-PING·Filed 2011·Granted Jul 8, 2014·0 cites·23 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →