Inventor · disambiguated record
Tze Sin Tan
Also filed as: TAN TZE SIN
6 granted patents·43 citations·filing 2008–2018
81Inventor score
Top patents by PatentIndex Score
6 records- 0184US9098486B1Methods and apparatus for testing multiple clock domain memoriesALTERA CORP·Filed 2013·Granted Aug 4, 2015·11 cites·18 claims
- 0282US9874607B1Method and apparatus for using programmable logic circuitry to test on-chip analog-to-digital converterALTERA CORP·Filed 2016·Granted Jan 23, 2018·6 cites·23 claims
- 0380US7996743B1Logic circuit testing with reduced overheadALTERA CORP·Filed 2008·Granted Aug 9, 2011·11 cites·21 claims
- 0477US7761754B1Techniques for testing memory circuitsALTERA CORP·Filed 2008·Granted Jul 20, 2010·11 cites·22 claims
- 0570US11257562B2Built-in-self-test circuits and methods using pipeline registersINTEL CORP·Filed 2018·Granted Feb 22, 2022·3 cites·21 claims
- 0650US7984344B1Techniques for testing memory circuitsALTERA CORP·Filed 2010·Granted Jul 19, 2011·1 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →