Inventor · disambiguated record
Tzong-Hsien Wu
Also filed as: WU TZONG-HSIEN
8 granted patents·10 citations·filing 2004–2010
78Inventor score
Top patents by PatentIndex Score
8 records- 0164US8343713B2Method for patterning material layerMACRONIX INT CO LTD·Filed 2008·Granted Jan 1, 2013·2 cites·17 claims
- 0259US8446565B2Methods of optical proximity correction in manufacturing semiconductor devicesHSUAN CHUNG TE·Filed 2010·Granted May 21, 2013·3 cites·18 claims
- 0359US7721247B2Side lobe image searching method in lithographyMACRONIX INT CO LTD·Filed 2006·Granted May 18, 2010·2 cites·6 claims
- 0458US7682756B2Anti-aberration pattern and method for manufacturing the sameMACRONIX INT CO LTD·Filed 2006·Granted Mar 23, 2010·1 cites·13 claims
- 0556US8148051B2Method and system for manufacturing openings on semiconductor devicesWU TZONG-HSIEN·Filed 2008·Granted Apr 3, 2012·2 cites·13 claims
- 0644US8154705B2Method of defining patterns in small pitch and corresponding exposure systemWU TZONG-HSIEN·Filed 2007·Granted Apr 10, 2012·0 cites·14 claims
- 0742US8072577B2Lithography systems and processesWU TZONG HSIEN·Filed 2006·Granted Dec 6, 2011·0 cites·12 claims
- 0837US7588864B2Mask, method of manufacturing mask, and lithographic processMACRONIX INT CO LTD·Filed 2004·Granted Sep 15, 2009·0 cites·26 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →