Inventor · disambiguated record
Ulrich Glaser
Also filed as: GLASER ULRICH
20 granted patents·1 pending application·102 citations·filing 2005–2019
93Inventor score
Top patents by PatentIndex Score
21 records- 0196US9413166B2Noise-tolerant active clamp with ESD protection capability in power up modeINFINEON TECHNOLOGIES AG·Filed 2014·Granted Aug 9, 2016·24 cites·17 claims
- 0295US9705026B2Method of triggering avalanche breakdown in a semiconductor deviceINFINEON TECHNOLOGIES AG·Filed 2016·Granted Jul 11, 2017·16 cites·6 claims
- 0395US9225163B2Combined ESD active clamp for cascaded voltage pinsINFINEON TECHNOLOGIES AG·Filed 2013·Granted Dec 29, 2015·24 cites·22 claims
- 0483US9401355B2Semiconductor device including a diode arranged in a trenchWEYERS JOACHIM·Filed 2011·Granted Jul 26, 2016·6 cites·29 claims
- 0581US10367350B2Central combined active ESD clampINFINEON TECHNOLOGIES AG·Filed 2016·Granted Jul 30, 2019·3 cites·20 claims
- 0681US9953968B2Integrated circuit having an ESD protection structure and photon sourceINFINEON TECHNOLOGIES AG·Filed 2015·Granted Apr 24, 2018·4 cites·25 claims
- 0781US9287377B2Semiconductor device and manufacturing methodINFINEON TECHNOLOGIES AG·Filed 2014·Granted Mar 15, 2016·4 cites·20 claims
- 0877US8643990B2Protection circuitCAO YIQUN·Filed 2011·Granted Feb 4, 2014·7 cites·25 claims
- 0974US9159719B2ESD protectionINFINEON TECHNOLOGIES AG·Filed 2013·Granted Oct 13, 2015·4 cites·15 claims
- 1069US7279726B2ESD protection deviceINFINEON TECHNOLOGIES AG·Filed 2006·Granted Oct 9, 2007·4 cites·20 claims
- 1168US9263619B2Semiconductor component and method of triggering avalanche breakdownINFINEON TECHNOLOGIES AG·Filed 2013·Granted Feb 16, 2016·2 cites·14 claims
- 1267US9891268B2Apparatus and method for generating signals for ESD stress testing an electronic device and system for performing an ESD stress test of an electronic deviceINFINEON TECHNOLOGIES AG·Filed 2015·Granted Feb 13, 2018·1 cites·20 claims
- 1361US8901647B2Semiconductor device including first and second semiconductor elementsINFINEON TECHNOLOGIES AG·Filed 2012·Granted Dec 2, 2014·2 cites·25 claims
- 1456US8530964B2Semiconductor device including first and second semiconductor elementsHIRLER FRANZ·Filed 2011·Granted Sep 10, 2013·1 cites·25 claims
- 1554US9947648B2Semiconductor device including a diode at least partly arranged in a trenchINFINEON TECHNOLOGIES AG·Filed 2016·Granted Apr 17, 2018·0 cites·30 claims
- 1650US7679103B2Integrated circuit arrangement with shockley diode or thyristor and method for production and use of a thyristorINFINEON TECHNOLOGIES AG·Filed 2006·Granted Mar 16, 2010·0 cites·14 claims
- 1748US7888701B2Integrated circuit arrangement with Shockley diode or thyristor and method for production and use of a thyristorINFINEON TECHNOLOGIES AG·Filed 2010·Granted Feb 15, 2011·0 cites·14 claims
- 1847US11316340B2Electrostatic discharge with parasitic compensationINFINEON TECHNOLOGIES AG·Filed 2019·Granted Apr 26, 2022·0 cites·20 claims
- 1944US10971488B2Active ESD clamp deactivationINFINEON TECHNOLOGIES AG·Filed 2018·Granted Apr 6, 2021·0 cites·20 claims
- 2042US8129292B2Integrated circuit arrangement with shockley diode or thyristor and method for production and use of a thyristorGLASER ULRICH·Filed 2010·Granted Mar 6, 2012·0 cites·6 claims
- 2135US2005179088A1ESD protective apparatus for a semiconductor circuit having an ESD protective circuit which makes contact with a substrate or guard ring contactINFINEON TECHNOLOGIES AG·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →