Inventor · disambiguated record
Ulf Lundström
Also filed as: LUNDSTRÖM ULF
12 granted patents·5 pending applications·8 citations·filing 2015–2023
83Inventor score
Top patents by PatentIndex Score
17 records- 0187US11579318B2Characterization of an electron beamEXCILLUM AB·Filed 2020·Granted Feb 14, 2023·2 cites·15 claims
- 0286US10971323B1Semiconductor X-ray targetEXCILLUM AB·Filed 2017·Granted Apr 6, 2021·5 cites·11 claims
- 0375US11892576B2Characterization of an electron beamEXCILLUM AB·Filed 2023·Granted Feb 6, 2024·0 cites·15 claims
- 0474US11800625B2Mechanical alignment of x-ray sourcesEXCILLUM AB·Filed 2019·Granted Oct 24, 2023·1 cites·14 claims
- 0569US12120807B2Mechanical alignment of x-ray sourcesEXCILLUM AB·Filed 2023·Granted Oct 15, 2024·0 cites·5 claims
- 0668US11979972B2X-ray source with an electromagnetic pumpEXCILLUM AB·Filed 2020·Granted May 7, 2024·0 cites·12 claims
- 0764US11910515B2X-ray source with an electromagnetic pumpEXCILLUM AB·Filed 2020·Granted Feb 20, 2024·0 cites·15 claims
- 0863US2025385064A1Small-target x-ray systemEXCILLUM AB·Filed 2023·Application pending·0 cites
- 0962US2025277754A1Secondary emission compensation in x-ray sourcesEXCILLUM AB·Filed 2023·Application pending·0 cites
- 1056US12310775B2X-ray systemEXCILLUM AB·Filed 2021·Granted May 27, 2025·0 cites·15 claims
- 1154US2025046560A1Method and arrangement for an x-ray sourceEXCILLUM AB·Filed 2022·Application pending·0 cites
- 1252US11651927B2Electron collector with oblique impact portionEXCILLUM AB·Filed 2019·Granted May 16, 2023·0 cites·15 claims
- 1351US11257651B2Determining width and height of electron spotEXCILLUM AB·Filed 2019·Granted Feb 22, 2022·0 cites·11 claims
- 1446US2023238204A1X-ray imaging systemEXCILLUM AB·Filed 2021·Application pending·0 cites
- 1543US11350512B2Method for controlling an x-ray sourceEXCILLUM AB·Filed 2019·Granted May 31, 2022·0 cites·11 claims
- 1643US2024284580A1Electromagnetic pumpEXCILLUM AB·Filed 2022·Application pending·0 cites
- 1738US10085702B2X-ray micro imagingJETTEC AB·Filed 2015·Granted Oct 2, 2018·0 cites·13 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →