Inventor · disambiguated record
Ungjin Jang
Also filed as: JANG UNGJIN
2 granted patents·2 pending applications·0 citations·filing 2014–2024
22Inventor score
Files withSAMSUNG ELECTRONICS CO LTD4
Top patents by PatentIndex Score
4 records- 0145US2025044353A1Semiconductor test apparatus and power supply method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0237US12111351B2Test devices, test systems, and operating methods of test systemsSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Oct 8, 2024·0 cites·19 claims
- 0332US2015058685A1Method and system of testing semiconductor memorySAMSUNG ELECTRONICS CO LTD·Filed 2014·Application pending·0 cites
- 0419US10262753B2Auxiliary test device, test board having the same, and test method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2016·Granted Apr 16, 2019·0 cites·11 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →