Inventor · disambiguated record
Ung-Gi Park
Also filed as: PARK UNG-GI
5 granted patents·26 citations·filing 1996–2018
73Inventor score
Top patents by PatentIndex Score
5 records- 0176US7733103B2Probe cardMICO TN LTD·Filed 2007·Granted Jun 8, 2010·15 cites·8 claims
- 0271US10670628B2Test probe and test device using the sameLEENO IND INC·Filed 2018·Granted Jun 2, 2020·1 cites·5 claims
- 0370US11408914B2MEMS probe and test device using the sameLEENO IND INC·Filed 2018·Granted Aug 9, 2022·1 cites·5 claims
- 0440US10656180B2Test deviceLEENO IND INC·Filed 2018·Granted May 19, 2020·0 cites·4 claims
- 0532US5644246AProbe card locking device of a semiconductor wafer probe stationHYUNDAI ELECTRONICS IND·Filed 1996·Granted Jul 1, 1997·9 cites·4 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →