Inventor · disambiguated record
Uri Hadar
Also filed as: HADAR URI
3 granted patents·7 pending applications·1 citations·filing 2014–2024
45Inventor score
Top patents by PatentIndex Score
10 records- 0182US12480898B2Z-profiling of wafers based on X-ray measurementsAPPLIED MATERIALS ISRAEL LTD·Filed 2022·Granted Nov 25, 2025·1 cites·20 claims
- 0262US2025216347A1Nondestructive estimation of structural properties of a specimen via x-ray modelling based on simulations and ground truth measurementsAPPLIED MATERIALS ISRAEL LTD·Filed 2024·Application pending·0 cites
- 0362US2025231132A1Nondestructive estimation of structural properties of a specimen via x-ray modelling based on ground truth measurementsAPPLIED MATERIALS ISRAEL LTD·Filed 2024·Application pending·0 cites
- 0461US2025130185A1Non-destructive three-dimensional probing and characterization of specimensAPPLIED MATERIALS ISRAEL LTD·Filed 2023·Application pending·0 cites
- 0558US2024255449A1Non-destructive classification of specimens based on energy signature measurementsAPPLIED MATERIALS ISRAEL LTD·Filed 2023·Application pending·0 cites
- 0656US2024096591A1Non-destructive sem-based depth-profiling of samplesAPPLIED MATERIALS ISRAEL LTD·Filed 2023·Application pending·0 cites
- 0754US2024085351A1Depth-profiling of samples based on x-ray measurementsAPPLIED MATERIALS ISRAEL LTD·Filed 2023·Application pending·0 cites
- 0854US2024094150A1Non-destructive sem-based depth-profiling of samplesAPPLIED MATERIALS ISRAEL LTD·Filed 2022·Application pending·0 cites
- 0941US12423798B2Shape localization for examining a semiconductor specimenAPPLIED MATERIALS ISRAEL LTD·Filed 2022·Granted Sep 23, 2025·0 cites·20 claims
- 1026US11037319B2Contaminant detection and bird risk management at airportsX SIGHT SYSTEMS LTD·Filed 2014·Granted Jun 15, 2021·0 cites·9 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →