Inventor · disambiguated record
Ursula Hedenig
Also filed as: HEDENIG URSULA
20 granted patents·4 pending applications·44 citations·filing 2012–2019
92Inventor score
Top patents by PatentIndex Score
24 records- 0193US10710874B2Micromechanical structure and method for manufacturing the sameINFINEON TECHNOLOGIES AG·Filed 2017·Granted Jul 14, 2020·9 cites·21 claims
- 0290US10345227B2Sensing systems and methods using a coupling structureINFINEON TECHNOLOGIES AG·Filed 2017·Granted Jul 9, 2019·4 cites·20 claims
- 0385US9212045B1Micro mechanical structure and method for fabricating the sameINFINEON TECHNOLOGIES AG·Filed 2014·Granted Dec 15, 2015·6 cites·26 claims
- 0483US9417186B2Opto-electronic sensorJAKOBY BERNHARD·Filed 2012·Granted Aug 16, 2016·10 cites·16 claims
- 0581US9702813B2Sensing systems and methods using a coupling structureINFINEON TECHNOLOGIES AG·Filed 2014·Granted Jul 11, 2017·3 cites·18 claims
- 0675US9618693B2Liquid sensing systems and methods using a ring resonator sensorINFINEON TECHNOLOGIES AG·Filed 2014·Granted Apr 11, 2017·2 cites·23 claims
- 0774US9610543B2Method for simultaneous structuring and chip singulationINFINEON TECHNOLOGIES AG·Filed 2014·Granted Apr 4, 2017·2 cites·17 claims
- 0872US10516943B2Microelectromechanical device, an array of microelectromechanical devices, a method of manufacturing a microelectromechanical device, and a method of operating a microelectromechanical deviceINFINEON TECHNOLOGIES AG·Filed 2016·Granted Dec 24, 2019·2 cites·24 claims
- 0972US9748140B1Method of manufacturing semiconductor devicesINFINEON TECHNOLOGIES AG·Filed 2016·Granted Aug 29, 2017·2 cites·15 claims
- 1065US9903816B2Photonic crystal sensor structure and a method for manufacturing the sameINFINEON TECHNOLOGIES AG·Filed 2014·Granted Feb 27, 2018·1 cites·24 claims
- 1164US10247671B2Photonic crystal sensor structure and a method for manufacturing the sameINFINEON TECHNOLOGIES AG·Filed 2018·Granted Apr 2, 2019·0 cites·20 claims
- 1264US10081533B2Micromechanical structure and method for fabricating the sameINFINEON TECHNOLOGIES AG·Filed 2014·Granted Sep 25, 2018·1 cites·39 claims
- 1364US8871550B2Method for processing a wafer at unmasked areas and previously masked areas to reduce a wafer thicknessGRILLE THOMAS·Filed 2012·Granted Oct 28, 2014·2 cites·25 claims
- 1458US2019204511A1Plasmonic and photonic wavelength separation filtersINFINEON TECHNOLOGIES AUSTRIA AG·Filed 2019·Application pending·0 cites
- 1557US10005659B2Method for simultaneous structuring and chip singulationINFINEON TECHNOLOGIES AG·Filed 2017·Granted Jun 26, 2018·0 cites·20 claims
- 1656US2016349456A1Plasmonic and photonic wavelength separation filtersINFINEON TECHNOLOGIES AUSTRIA AG·Filed 2016·Application pending·0 cites
- 1753US10461203B2Semiconductor devices, a fluid sensor and a method for forming a semiconductor deviceINFINEON TECHNOLOGIES AG·Filed 2018·Granted Oct 29, 2019·0 cites·9 claims
- 1850US9941432B2Semiconductor devices, a fluid sensor and a method for forming a semiconductor deviceINFINEON TECHNOLOGIES AG·Filed 2016·Granted Apr 10, 2018·0 cites·14 claims
- 1947US9939331B2System and method for a capacitive thermometerINFINEON TECHNOLOGIES AG·Filed 2014·Granted Apr 10, 2018·0 cites·24 claims
- 2046US9439017B2Method for manufacturing a plurality of microphone structures, microphone and mobile deviceINFINEON TECHNOLOGIES AG·Filed 2014·Granted Sep 6, 2016·0 cites·16 claims
- 2140US10106398B2Micromechanical structure comprising carbon material and method for fabricating the sameINFINEON TECHNOLOGIES AG·Filed 2015·Granted Oct 23, 2018·0 cites·33 claims
- 2239US2014335700A1Carbon Layers for High Temperature ProcessesINFINEON TECHNOLOGIES AG·Filed 2013·Application pending·0 cites
- 2333US10217644B2Production of adhesion structures in dielectric layers using photoprocess technology and devices incorporating adhesion structuresGRILLE THOMAS·Filed 2012·Granted Feb 26, 2019·0 cites·20 claims
- 2430US2017355591A1Microelectromechanical device and a method of manufacturing a microelectromechanical deviceINFINEON TECHNOLOGIES AG·Filed 2016·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →