Inventor · disambiguated record
V. Swamy Irrinki
Also filed as: IRRINKI V SWAMY
20 granted patents·1,917 citations·filing 1996–2000
97Inventor score
Top patents by PatentIndex Score
20 records- 0198US6067262ARedundancy analysis for embedded memories with built-in self test and built-in self repairLSI LOGIC CORP·Filed 1998·Granted May 23, 2000·507 cites·22 claims
- 0296US6367042B1Testing methodology for embedded memories using built-in self repair and identification circuitryLSI LOGIC CORP·Filed 1998·Granted Apr 2, 2002·170 cites·20 claims
- 0396US5784328AMemory system including an on-chip temperature sensor for regulating the refresh rate of a DRAM arrayLSI LOGIC CORP·Filed 1996·Granted Jul 21, 1998·209 cites·18 claims
- 0495US6061814ATest circuitry for determining the defect density of a semiconductor process as a function of individual metal layersLSI LOGIC CORP·Filed 1998·Granted May 9, 2000·135 cites·22 claims
- 0594US6574762B1Use of a scan chain for configuration of BIST unit operationLSI LOGIC CORP·Filed 2000·Granted Jun 3, 2003·142 cites·9 claims
- 0694US5982659AMemory cell capable of storing more than two logic states by using different via resistancesLSI LOGIC CORP·Filed 1996·Granted Nov 9, 1999·128 cites·19 claims
- 0792US5987632AMethod of testing memory operations employing self-repair circuitry and permanently disabling memory locationsLSI LOGIC CORP·Filed 1997·Granted Nov 16, 1999·106 cites·19 claims
- 0891US6255836B1Built-in self-test unit having a reconfigurable data retention testLSI LOGIC CORP·Filed 2000·Granted Jul 3, 2001·52 cites·7 claims
- 0991US5956350ABuilt in self repair for DRAMs using on-chip temperature sensing and heatingLSI LOGIC CORP·Filed 1997·Granted Sep 21, 1999·91 cites·18 claims
- 1088US6681358B1Parallel testing of a multiport memoryLSI LOGIC CORP·Filed 2000·Granted Jan 20, 2004·67 cites·20 claims
- 1181US6671842B1Asynchronous bist for embedded multiport memoriesLSI LOGIC CORP·Filed 1999·Granted Dec 30, 2003·51 cites·19 claims
- 1280US6757854B1Detecting faults in dual port FIFO memoriesLSI LOGIC CORP·Filed 1999·Granted Jun 29, 2004·46 cites·33 claims
- 1378US5822228AMethod for using built in self test to characterize input-to-output delay time of embedded cores and other integrated circuitsLSI LOGIC CORP·Filed 1997·Granted Oct 13, 1998·42 cites·21 claims
- 1476US5808932AMemory system which enables storage and retrieval of more than two states in a memory cellLSI LOGIC CORP·Filed 1996·Granted Sep 15, 1998·39 cites·18 claims
- 1574US5761110AMemory cell capable of storing more than two logic states by using programmable resistancesLSI LOGIC CORP·Filed 1996·Granted Jun 2, 1998·34 cites·20 claims
- 1668US6496950B1Testing content addressable static memoriesLSI LOGIC CORP·Filed 1999·Granted Dec 17, 2002·28 cites·12 claims
- 1766US5867423AMemory circuit and method for multivalued logic storage by process variationsLSI LOGIC CORP·Filed 1997·Granted Feb 2, 1999·25 cites·22 claims
- 1859US6550032B1Detecting interport faults in multiport static memoriesLSI LOGIC CORP·Filed 1999·Granted Apr 15, 2003·18 cites·41 claims
- 1959US5847990ARam cell capable of storing 3 logic statesLSI LOGIC CORP·Filed 1996·Granted Dec 8, 1998·19 cites·5 claims
- 2039US6101458AAutomatic ranging apparatus and method for precise integrated circuit current measurementsLSI LOGIC·Filed 1997·Granted Aug 8, 2000·8 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →