Inventor · disambiguated record
Valentin Cherepin
Also filed as: CHEREPIN VALENTIN · CHEREPIN VALENTIN TIKHONOVICH
1 granted patent·2 pending applications·11 citations·filing 1977–2012
33Inventor score
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3 records- 0149US4107527AIon-emission microanalyzer microscopeCHEREPIN VALENTIN TIKHONOVICH·Filed 1977·Granted Aug 15, 1978·11 cites·3 claims
- 0239US2008078750A1Directed Multi-Deflected Ion Beam Milling of a Work Piece and Determining and Controlling Extent ThereofSELA SEMICONDUCTOR ENG LABORATORIES·Filed 2005·Application pending·0 cites
- 0339US2013180843A1Directed multi-deflected ion beam milling of a work piece and determining and controlling extent thereofBOGUSLAVSKY DIMITRI·Filed 2012·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →