Inventor · disambiguated record
Van Huynh
Also filed as: HUYNH VAN · HUYNH VAN C
8 granted patents·69 citations·filing 1999–2018
86Inventor score
Top patents by PatentIndex Score
8 records- 0189US10489086B1Reducing read errors by performing mitigation reads to blocks of non-volatile memoryIBM·Filed 2018·Granted Nov 26, 2019·7 cites·19 claims
- 0282US6418070B1Memory device tester and method for testing reduced power statesMICRON TECHNOLOGY INC·Filed 1999·Granted Jul 9, 2002·36 cites·22 claims
- 0377US10770155B2Determining a read apparent voltage infector page and infected pageIBM·Filed 2018·Granted Sep 8, 2020·2 cites·20 claims
- 0466US6775192B2Memory device tester and method for testing reduced power statesMICRON TECHNOLOGY INC·Filed 2002·Granted Aug 10, 2004·10 cites·36 claims
- 0566US6674677B2Memory device tester and method for testing reduced power statesMICRON TECHNOLOGY INC·Filed 2002·Granted Jan 6, 2004·10 cites·30 claims
- 0657US7161866B2Memory device tester and method for testing reduced power statesMICRON TECHNOLOGY INC·Filed 2005·Granted Jan 9, 2007·2 cites·35 claims
- 0752US11086565B2Reducing effects of read array operations of read apparent voltageIBM·Filed 2018·Granted Aug 10, 2021·0 cites·20 claims
- 0843US6914843B2Memory device tester and method for testing reduced power statesMICRON TECHNOLOGY INC·Filed 2002·Granted Jul 5, 2005·2 cites·33 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →